Abstract
The Korea standard block cipher, SEED, is a 128-bit symmetric block cipher with a more complex F function than DES. This paper shows that SEED is vulnerable to two types of side channel attacks, a fault analysis attack and a power analysis attack. The first one is a fault insertion analysis which induces permanent faults on the whole left register of 15-round. This attack allows one to obtain the secret key by using only two faulty cipher texts for encryption and decryption processing respectively. The second attack is a more realistic differential power analysis. This attack requires about 1000 power traces to find the full secret key. The above two attacks use a reverse property of the F function to obtain secret key, where the reverse property is derived from the our research.
This research has been supported by University IT Research Center Project.
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Anderson, R., Kuhn, M.: Tamper resistance — a cautionary note. In: Proc. of the Second USENIX Workshop on Electronic Commerce, pp. 1–11 (November 1996), Available from http://www.usenix.org
Aumüller, C., Bier, P., Fischer, W., Hofreiter, P., Seifrert, J.: Fault attacks on RSA with CRT: Concrete results and practical countermeasures. In: Kaliski Jr., B.S., Koç, Ç.K., Paar, C. (eds.) CHES 2002. LNCS, vol. 2523, pp. 260–275. Springer, Heidelberg (2003)
Biham, E., Shmir, A.: Differential cryptanalysis of the full 16-round DES. In: Brickell, E.F. (ed.) CRYPTO 1992. LNCS, vol. 740, pp. 487–496. Springer, Heidelberg (1993)
Biham, E., Shamir, A.: Differential fault analysis of secret key cryptosystems. In: Kaliski Jr., B.S. (ed.) CRYPTO 1997. LNCS, vol. 1294, pp. 513–525. Springer, Heidelberg (1997)
Boer, B., Lemke, K., Wieke, G.: A DPA attack against the modular reduction within a CRT implementation of RSA. In: Kaliski Jr., B.S., Koç, Ç.K., Paar, C. (eds.) CHES 2002. LNCS, vol. 2523, pp. 228–243. Springer, Heidelberg (2003)
Boneh, D., DeMillo, R.A., Liption, R.J.: On the importance of checking cryptographic protocols for faults. In: Fumy, W. (ed.) EUROCRYPT 1997. LNCS, vol. 1233, pp. 37–51. Springer, Heidelberg (1997)
Coron, J.: Resistance against differential power analysis for elliptic curve cryptosystems. In: Koç, Ç.K., Paar, C. (eds.) CHES 1999. LNCS, vol. 1717, pp. 292–302. Springer, Heidelberg (1999)
Dhem, J.F., Feyt, N.: Hardware and software symbiosis helps smartcard evolution. In: IEEE Micro 21, pp. 14–25 (2001)
Dusart, P., Letourneux, G., Vivolo, O.: Differential fault analysis on A.E.S. In: Zhou, J., Yung, M., Han, Y. (eds.) ACNS 2003. LNCS, vol. 2846, pp. 293–306. Springer, Heidelberg (2003)
Feyt, N.: Countermeasure method for a microcontroller based on a pipeline architecture. United States Patent 20030115478, June 19 (2003)
Giraud, C.: DFA on AES. IACR, Cryptology ePrint Archive (2003), Available from http://eprint.iacr.org/2003/008/
Ha, J.C., Moon, S.J.: Randomized signed-scalar multiplication of ECC to resist power attacks. In: Kaliski Jr., B.S., Koç, Ç.K., Paar, C. (eds.) CHES 2002. LNCS, vol. 2523, pp. 551–563. Springer, Heidelberg (2003)
den Hartog, J.I., Verschuren, J., de Vink, E.P., Vos, J., Wiersma, W.: PINPAS: a tool for power analysis of smartcards. In: Information Security Conference — SEC 2003, pp. 453–457. Kluwer Academic, Dordrecht (2003)
ISO/IEC JTC 1/SC27, Third Party Evaluation on SEED by CRYPTEC, ISO/IEC JTC 1/SC27 N3213, April 23 (2002)
Joye, M., Lenstra, A.K., Quisquater, J.-J.: Chinese remaindering based cryptosystems in the presence of faults. Journal of Cryptology 12(4), 241–245 (1999)
Karri, R., Wu, K., Mishra, P., Kim, Y.: Concurrent error detection of faultbased side-channal cryptanalysis of 128-bit symmetric block ciphers. In: Proc. of IEEE DEsign Automation Conference, pp. 579–585 (2001)
Kocher, P., Jaffe, J., Jun, B.: Differential power analysis. In: Wiener, M. (ed.) CRYPTO 1999. LNCS, vol. 1666, pp. 388–397. Springer, Heidelberg (1999)
Korea Information Security Agency, Block Cipher Algorithm SEED, Available from http://www.kisa.or.kr/seed/seed_eng.html
Lenstra, A.K.: Memo on RSA signature generation in the presence of faults (September 1996)
Messerges, T., Dabbish, E., Sloan, R.: Power analysis attacks of modular exponentiation in smartcards. In: Koç, Ç.K., Paar, C. (eds.) CHES 1999. LNCS, vol. 1717, pp. 144–157. Springer, Heidelberg (1999)
Messerges, T.: Securing the AES finalists against power analysis attacks. In: Schneier, B. (ed.) FSE 2000. LNCS, vol. 1978, pp. 150–164. Springer, Heidelberg (2001)
Muir, J.A.: Techniques of Side Channel Cryptanalysis, masters thesis (2001), Available from http://www.math.uwaterloo.ca/~jamuir/sidechannel.htm
Skorobogatov, S.P., Anderson, R.J.: Optical fault induction attacks. In: Kaliski Jr., B.S., Koç, Ç.K., Paar, C. (eds.) CHES 2002. LNCS, vol. 2523, pp. 2–12. Springer, Heidelberg (2003)
Tiri, K., Akmal, M., Verbauwhede, I.: A Dynamic and Differential CMOS Logic with Signal Independent Power Consumption to Withstand Differential Power Analysis on Smart Cards. In: 28th European Solid-State Circuits Conference – ESSCIRC 2002 (September 2002)
Walter, C.D.: Some security aspacts of the MIST randomized exponentiation algorithm. In: Kaliski Jr., B.S., Koç, Ç.K., Paar, C. (eds.) CHES 2002. LNCS, vol. 2523, pp. 564–578. Springer, Heidelberg (2003)
Yen, S.M., Moon, S.J., Ha, J.C.: Hardware fault attack on RSA with CRT revisited. In: Lee, P.J., Lim, C.H. (eds.) ICISC 2002. LNCS, vol. 2587, pp. 374–388. Springer, Heidelberg (2003)
Yen, S.M., Moon, S.J., Ha, J.C.: Permanent fault attack on the parameters of RSA with CRT. In: Safavi-Naini, R., Seberry, J. (eds.) ACISP 2003. LNCS, vol. 2727, pp. 285–296. Springer, Heidelberg (2003)
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Yoo, H., Kim, C., Ha, J., Moon, S., Park, I. (2005). Side Channel Cryptanalysis on SEED. In: Lim, C.H., Yung, M. (eds) Information Security Applications. WISA 2004. Lecture Notes in Computer Science, vol 3325. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-31815-6_33
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DOI: https://doi.org/10.1007/978-3-540-31815-6_33
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