Abstract
An Wavelet analysis tool is utilized for the detection of oscillations in actual industrial chemical plants. It can detect multiple oscillations in measurement signals and shows valuable information for the diagnosis. For each of the detected oscillatory control loops, the root cause of the oscillation is diagnosed by the analysis of input-output characteristics of a valve. Finally, the combination of the Wavelet tool and the analysis of MV-PV plots is shown to be a powerful practical method for the detection and diagnosis of oscillations in process plants.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Horsh, A.: Condition Monitoring of Control Loops, PhD Thesis, Royal Institute of Technology, Stockholm, Sweden (2000)
Thornhill, N.F., Shah, S.L., Huang, B.: Detection of Distributed Oscillations and Root-Cause Diagnosis. In: CHEMFAS4, Korea, June 2001, pp. 167–172 (2001)
Matsuo, T., Sasaoka, H.: Application of Wavelet analysis to chemical process diagnosis. In: KES 2002, Crema, Italy, pp. 843–847 (2002)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2003 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Matsuo, T., Sasaoka, H., Yamashita, Y. (2003). Detection and Diagnosis of Oscillations in Process Plants. In: Palade, V., Howlett, R.J., Jain, L. (eds) Knowledge-Based Intelligent Information and Engineering Systems. KES 2003. Lecture Notes in Computer Science(), vol 2773. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-45224-9_170
Download citation
DOI: https://doi.org/10.1007/978-3-540-45224-9_170
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-40803-1
Online ISBN: 978-3-540-45224-9
eBook Packages: Springer Book Archive