Skip to main content

Selecting an Appropriate Segmentation Method Automatically Using ANN Classifier

  • Conference paper
New Trends in Applied Artificial Intelligence (IEA/AIE 2007)

Part of the book series: Lecture Notes in Computer Science ((LNAI,volume 4570))

Abstract

In general, we can easily determine the manufacturing step that does not function properly by referring to the flaw type. However, a successful segmentation of flaws is the prerequisite for the success of the subsequent flaw classification. It is worth noticing that, different segmentation methods are needed for different types of images. In the study, a mechanism that is capable of choosing a proper segmentation method automatically has been proposed. The mechanism employed artificial neural networks to select a suitable segmentation method from three methods, i.e., Otsu, HV standard deviation, and Gradient Otsu. The selection is based on the four features extracted from an image including standard deviation of background image, variance coefficient, the ratio of the width to height of both foreground and background histograms. The results show the success of the proposed mechanism. The high segmentation rate reflects the fact that the four carefully selected features are adequate.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 84.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Ng, H.F.: Automatic Thresholding for Defect Detection. In: Proc. 3rd Int. Conf. Image and Graphics, pp. 532–535 (2004)

    Google Scholar 

  2. Yeh, C., Perng, D.B.: A Reference Standard of Defect Compensation for Leather Transactions. The Int. J. of Advanced Manufacturing Technology 25(11-12), 1197–1204 (2005)

    Article  Google Scholar 

  3. Mery, D., Carrasco, M.: Automated Multiple View Inspection Based on Uncalibrated Image Sequences. In: Kalviainen, H., Parkkinen, J., Kaarna, A. (eds.) SCIA 2005. LNCS, vol. 3540, pp. 1238–1247. Springer, Heidelberg (2005)

    Google Scholar 

  4. Cheriet, M., Said, J.N., Suen, C.Y.: A Recursive Thresholding Technique for Image Segmentation. IEEE Trans. Image Processing 7(6), 918–921 (1998)

    Article  Google Scholar 

  5. Chan, F.H.Y., Lam, F.K., Hui, Z.: Adaptive Thresholding by Variational Method. IEEE Trans. Image Processing 7(3), 468–473 (1998)

    Article  Google Scholar 

  6. Mery, D.: Crossing Line Profile: A New Approach to Detecting Defects in Aluminum Die Castings. In: Bigun, J., Gustavsson, T. (eds.) SCIA 2003. LNCS, vol. 2749, pp. 725–732. Springer, Heidelberg (2003)

    Google Scholar 

  7. Gao, H., Siu, W.C., Hou, C.H.: Improved Techniques for Automatic Image Segmentation. IEEE Trans. Circuits Syst. Video Technol. 11(12), 1273–1280 (2001)

    Article  Google Scholar 

  8. Tancharoen, D., Jitapunkul, S., Chompun, S.: Spatial Segmentation based on Modified Morphological Tools. In: Proc. Int. Conf. Information Technology: Coding and Computing, pp. 478–482 (2001)

    Google Scholar 

  9. Bellon, O.R.P., Silva, L.: New Improvements to Range Image Segmentation by Edge Detection. IEEE Signal Processing Lett. 9(2), 43–45 (2002)

    Article  Google Scholar 

  10. Stojanovic, R., Mitropulos, P., Koulamas, C., Karayiannis, Y., Koubias, S., Papadopoulos, G.: Real-time Vision-based System for Textile Fabric Inspection. Real-Time Imaging. 7(6), 507–518 (2001)

    Article  MATH  Google Scholar 

  11. Sauvola, J., Pietikainen, M.: Adaptive Document Image Binarization. Pattern Recognition 33, 225–236 (1999)

    Article  Google Scholar 

  12. Otsu, N.: Threshold Selection Method from Gray-Level Histograms. IEEE Trans. Syst. Man, Cybern. SMC-9(1), 62–66 (1979)

    Google Scholar 

  13. Freeman, J.A., Skapura, D.M.: Neural Networks Algorithms, Applications and Programming Techniques, 1st edn. pp. 89–128. Addison-Wesley, London (1991)

    MATH  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Hiroshi G. Okuno Moonis Ali

Rights and permissions

Reprints and permissions

Copyright information

© 2007 Springer Berlin Heidelberg

About this paper

Cite this paper

Chiou, YC., Tsai, MR. (2007). Selecting an Appropriate Segmentation Method Automatically Using ANN Classifier. In: Okuno, H.G., Ali, M. (eds) New Trends in Applied Artificial Intelligence. IEA/AIE 2007. Lecture Notes in Computer Science(), vol 4570. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-73325-6_20

Download citation

  • DOI: https://doi.org/10.1007/978-3-540-73325-6_20

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-73322-5

  • Online ISBN: 978-3-540-73325-6

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics