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Metamodel for Tracing Concerns Across the Life Cycle

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Early Aspects: Current Challenges and Future Directions (EAW 2007)

Part of the book series: Lecture Notes in Computer Science ((LNPSE,volume 4765))

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Abstract

Several aspect-oriented approaches have been proposed to specify aspects at different phases in the software life cycle. Aspects can appear within a phase, be refined or mapped to other aspects in later phases, or even disappear. Tracing aspects is necessary to support understandability and maintainability of software systems. Although several approaches have been introduced to address traceability of aspects, two important limitations can be observed. First, tracing is not yet tackled for the entire life cycle. Second, the traceability model that is applied usually refers to elements of specific aspect languages, thereby limiting the reusability of the adopted traceability model. We propose the concern traceability metamodel (CTM) that enables traceability of concerns throughout the life cycle, and which is independent from the aspect languages that are used. CTM can be enhanced to provide additional properties for tracing, and be instantiated to define customized traceability models with respect to the required aspect languages. We have implemented CTM in the tool M-Trace, that uses XML-based representations of the models and XQuery queries to represent tracing information. CTM and M-Trace are illustrated for a Concurrent Versioning System to trace aspects from the requirements level to architecture design level and the implementation.

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Ana Moreira John Grundy

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Tekinerdoğan, B., Hofmann, C., Akşit, M., Bakker, J. (2007). Metamodel for Tracing Concerns Across the Life Cycle. In: Moreira, A., Grundy, J. (eds) Early Aspects: Current Challenges and Future Directions. EAW 2007. Lecture Notes in Computer Science, vol 4765. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-76811-1_10

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  • DOI: https://doi.org/10.1007/978-3-540-76811-1_10

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-76810-4

  • Online ISBN: 978-3-540-76811-1

  • eBook Packages: Computer ScienceComputer Science (R0)

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