Abstract
Developing models for fault localization in HDL designs has been an active research area in recent years. Whereas research on circuit verification is typically conducted on Verilog programs, research on fault localization has recently focused on the VHDL domain. The research presented herein focuses on fault localization models for Verilog designs and thus promotes the investigation of the relationships between models for property verification and fault localization. Primarily we focus on two novel contributions. First, this article points out notable semantic differences between VHDL and Verilog models and discusses its implications for fault localizations. Secondly, we advance existing work by incorporating multiple testcases and provide first empirical results obtained from the the ISCAS 89 benchmarks indicating our novel technique’s applicability for real world designs.
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References
Brayton, R.K., et al.: VIS: A system for verification and synthesis. In: Alur, R., Henzinger, T.A. (eds.) CAV 1996. LNCS, vol. 1102, pp. 428–432. Springer, Heidelberg (1996)
de Kleer, J., Williams, B.C.: Diagnosing multiple faults. Artificial Intelligence 32(1), 97–130 (1987)
Esser, M., Struss, P.: Fault-model-based test generation for embedded software. In: IJCAI, pp. 342–347 (2007)
Gordon, M.J.C.: Relating event and trace semantics of hardware description languages. The Computer Journal 45(1), 27–36 (2002)
Greiner, R., Smith, B.A., Wilkerson, R.W.: A correction to the algorithm in Reiter’s theory of diagnosis. Artificial Intelligence 41(1), 79–88 (1989)
Griesmayer, A., Staber, S., Bloem, R.: Automated fault localization in c programs. In: Proceedings of the First Workshop on Verification and Debugging (V&D 2006), pp. 95–111 (2006)
Hou, A.: A theory of measurement in diagnosis from first principles. Artificial Intelligence, pp. 281–328 (1991)
IEEE. IEEE Standard VHDL Language Reference Manual LRM Std 1076-1987, 1988. Institute of Electrical and Electronics Engineers, Inc. IEEE
IEEE. IEEE Standard Verilog Language Reference Manual LRM Std 11364-1995, 1995. Institute of Electrical and Electronics Engineers, Inc. IEEE
Meerwijk, A., Priest, C.: Using multiple tests for model-based diagnosis. In: Proceedings of the Third International Workshop on Principles of Diagnosis, Washington, pp. 30–39 (1992)
Peischl, B., Köb, D., Wotawa, F.: Debugging VHDL designs using temporal process instances. In: Chung, P.W.H., Hinde, C.J., Ali, M. (eds.) IEA/AIE 2003. LNCS, vol. 2718, pp. 402–415. Springer, Heidelberg (2003)
Peischl, B., Wotawa, F.: Automated source-level error localization in hardware designs. IEEE Des. Test 23(1), 8–19 (2006)
Reiter, R.: Towards a logical reconstruction of relational database theory. In: Brodie, M.L., Mylopoulos, J., Schmidt, J.W. (eds.) On Conceptual Modelling, Springer, Heidelberg (1984)
Reiter, R.: A theory of diagnosis from first principles. Artificial Intelligence 32(1), 57–95 (1987)
Wotawa, F.: On the relationship between model-based debugging and program mutation. In: Proceedings of the Twelfth International Workshop on Principles of Diagnosis, Sansicario, Italy (2001)
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Peischl, B., Riaz, N., Wotawa, F. (2008). Advances in Automated Source-Level Debugging of Verilog Designs. In: Nguyen, N.T., Katarzyniak, R. (eds) New Challenges in Applied Intelligence Technologies. Studies in Computational Intelligence, vol 134. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-79355-7_35
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DOI: https://doi.org/10.1007/978-3-540-79355-7_35
Publisher Name: Springer, Berlin, Heidelberg
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