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Guided Test Generation from CSP Models

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Part of the book series: Lecture Notes in Computer Science ((LNTCS,volume 5160))

Abstract

We introduce an approach for the construction of feature test models expressed in the CSP process algebra, from use cases described in a controlled natural language. From these models, our strategy automatically generates test cases for both individual features and feature interactions, in the context of an industrial cooperation with Motorola Inc., where each feature represents a mobile device functionality. The test case generation can be guided by test purposes, which allow selection based on particular traces of interest. More generally, we characterise a testing theory in terms of CSP: test models, test purposes, test cases, test execution, test verdicts and soundness are entirely defined in terms of CSP processes and refinement notions. We have also developed a tool, ATG, which mechanises the entire generation process.

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John S. Fitzgerald Anne E. Haxthausen Husnu Yenigun

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© 2008 Springer-Verlag Berlin Heidelberg

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Nogueira, S., Sampaio, A., Mota, A. (2008). Guided Test Generation from CSP Models. In: Fitzgerald, J.S., Haxthausen, A.E., Yenigun, H. (eds) Theoretical Aspects of Computing - ICTAC 2008. ICTAC 2008. Lecture Notes in Computer Science, vol 5160. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-85762-4_18

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  • DOI: https://doi.org/10.1007/978-3-540-85762-4_18

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-85761-7

  • Online ISBN: 978-3-540-85762-4

  • eBook Packages: Computer ScienceComputer Science (R0)

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