Skip to main content

On Independence and Sensitivity of Statistical Randomness Tests

  • Conference paper
Sequences and Their Applications - SETA 2008 (SETA 2008)

Part of the book series: Lecture Notes in Computer Science ((LNTCS,volume 5203))

Included in the following conference series:

  • 1101 Accesses

Abstract

Statistical randomness testing has significant importance in analyzing the quality of random number generators. In this study, we focus on the independence of randomness tests and its effect on the coverage of test suites. We experimentally observe that frequency, overlapping template, longest run of ones, random walk height and maximum order complexity tests are correlated for short sequences. We also proposed the concept of sensitivity, where we analyze the effect of simple transformations on output p-values. We claim that whenever the effect is significant, the composition of the transformation and the test may be included to the suite as a new test.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Similar content being viewed by others

References

  1. Rukhin, A., Soto, J., Nechvatal, J., Smid, M., Barker, E., Leigh, S., Levenson, M., Vangel, M., Banks, D., Heckert, A., Dray, J., Vo, S.: A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications (2001), http://www.nist.gov

  2. Marsaglia, G.: The Marsaglia Random Number CDROM including the DIEHARD Battery of Tests of Randomness (1996)

    Google Scholar 

  3. Caelli, W., Dawson, E., Nielsen, L., Gustafson, H.: CRYPT–X Statistical Package Manual, Measuring the Strength of Stream and Block ciphers (1992)

    Google Scholar 

  4. Knuth, D.E.: Seminumerical Algorithms. The Art of Computer Programming, vol. 2. Addison-Wesley, Reading (1981)

    MATH  Google Scholar 

  5. L’Ecuyer, P., Simard, R.: TestU01: A C library for Empirical Testing of Random Number Generators. ACM Transactions on Mathematical Software (to appear, 2006)

    Google Scholar 

  6. Soto, J.: Randomness Testing of the AES Candidate Algorithms (1999)

    Google Scholar 

  7. Hellekalek, P., Wegenkittl, S.: Empirical Evidence Concerning AES. ACM Trans. Model. Comput. Simul. 13(4), 322–333 (2003)

    Article  Google Scholar 

  8. Doğanaksoy, A., Göloğlu, F.: On Lempel-Ziv Complexity of Sequences. In: Gong, G., Helleseth, T., Song, H.-Y., Yang, K. (eds.) SETA 2006. LNCS, vol. 4086, pp. 180–189. Springer, Heidelberg (2006)

    Chapter  Google Scholar 

  9. Kasselman, P.: A Statistical Test for Stream Ciphers Based on the Maximum Order Complexity. In: South African Symposium On Communication and Signal Processing, pp. 213–218 (1998)

    Google Scholar 

  10. Robshaw, M.: Stream Ciphers. Technical Report TR - 701 (1994)

    Google Scholar 

  11. L’Ecuyer, P.: Testing Random Number Generators. In: Proceedings of the 1992 Winter Simulation Conference, pp. 305–313. IEEE Press, Los Alamitos (1992)

    Google Scholar 

  12. Massey, J.L., Serconek, S.: A Fourier Transform Approach to the Linear Complexity of Nonlinearly Filtered Sequences. In: Desmedt, Y.G. (ed.) CRYPTO 1994. LNCS, vol. 839, pp. 332–340. Springer, Heidelberg (1994)

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Solomon W. Golomb Matthew G. Parker Alexander Pott Arne Winterhof

Rights and permissions

Reprints and permissions

Copyright information

© 2008 Springer-Verlag Berlin Heidelberg

About this paper

Cite this paper

Sönmez Turan, M., DoĞanaksoy, A., Boztaş, S. (2008). On Independence and Sensitivity of Statistical Randomness Tests. In: Golomb, S.W., Parker, M.G., Pott, A., Winterhof, A. (eds) Sequences and Their Applications - SETA 2008. SETA 2008. Lecture Notes in Computer Science, vol 5203. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-85912-3_2

Download citation

  • DOI: https://doi.org/10.1007/978-3-540-85912-3_2

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-85911-6

  • Online ISBN: 978-3-540-85912-3

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics