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An Improved Upward Planarity Testing Algorithm and Related Applications

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WALCOM: Algorithms and Computation (WALCOM 2009)

Part of the book series: Lecture Notes in Computer Science ((LNTCS,volume 5431))

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Abstract

We consider the standard algorithm to test the upward planarity of embedded digraphs by Bertolazzi et al.[3]. We show how to improve its running time from O(n + r 2) to \(O(n+r^{\frac{3}{2}})\), where r is the number of sources and sinks in the digraph. We also discuss 2 applications of this technique: finding a certificate of correctness of an implementation of our upward planarity testing algorithm; and improving the running time of getting a quasi-upward planar drawing for an embedded digraph with minimum number of bends.

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Author information

Authors and Affiliations

  1. National University of Computer and Emerging Sciences, Lahore, Pakistan

    Sarmad Abbasi

  2. Computer Science Department, University of Limerick, Ireland

    Patrick Healy & Aimal Rextin

Authors
  1. Sarmad Abbasi
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  2. Patrick Healy
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  3. Aimal Rextin
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Editor information

Editors and Affiliations

  1. Indian Statistical Institute, 700 108, Kolkata, India

    Sandip Das

  2. Japan Advanced Institute of Science and Technology, 923-1292, Ishikawa, Japan

    Ryuhei Uehara

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© 2009 Springer-Verlag Berlin Heidelberg

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Abbasi, S., Healy, P., Rextin, A. (2009). An Improved Upward Planarity Testing Algorithm and Related Applications. In: Das, S., Uehara, R. (eds) WALCOM: Algorithms and Computation. WALCOM 2009. Lecture Notes in Computer Science, vol 5431. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-00202-1_29

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  • DOI: https://doi.org/10.1007/978-3-642-00202-1_29

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-00201-4

  • Online ISBN: 978-3-642-00202-1

  • eBook Packages: Computer ScienceComputer Science (R0)

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