Skip to main content

Fault Diagnosis of Analog IC Based on Wavelet Neural Network Ensemble

  • Conference paper
Advances in Neural Networks – ISNN 2009 (ISNN 2009)

Part of the book series: Lecture Notes in Computer Science ((LNTCS,volume 5553))

Included in the following conference series:

Abstract

A new method of analog IC fault diagnosis is proposed in this paper, which is based on wavelet neural network ensemble (WNNE) technique and Adaboost algorithm. This makes the way of the directory be of use in fault, and enhances the validity of the fault diagnosis. Using wavelet decomposition as a tool for extracting feature, Then, after training the WNNE by faulty feature vectors, the fault diagnosis of a radar scanning circuit is implemented with this new method. The simulation results show that the new method is more effective than the traditional wavelet neural network (WNN) method.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 129.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Aminian, M., Aminian, F.: Neural-network based analog-circuit fault diagnosis using wavelet transform as preprocessor. IEEE Transaction on Circuits and Systems 47, 151–156 (2000)

    Google Scholar 

  2. Martin, H.T.: Back propagation neural network design. China Machinery Press, Beijing (2002)

    Google Scholar 

  3. Stopjakova, V., Micusik, D., L’Benuskova, et al.: Neural networks-based parametric testing of analog IC. In: Proc. of IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp. 408–416 (2002)

    Google Scholar 

  4. He, Y., Ding, Y., Sun, Y.: Fault diagnosis of analog circuits with tolerances using artificial neural networks. In: Proc. IEEE APCCAS, Tianjin, pp. 292–295 (2000)

    Google Scholar 

  5. Hansen, L.K., Peter, S.: Neural network ensemble. IEEE Trans Pattern Analysis and Machine Intelligence 12, 993–1001 (1990)

    Article  Google Scholar 

  6. James, W., Taylor, Roberto, B.: Neural network load forecasting with weather ensemble predictions. IEEE Transaction on Power Systems 17, 626–632 (2002)

    Article  Google Scholar 

  7. Abdullah, M.H.L.B., Ganapathy, V.: Neural network ensemble for financial trend prediction. In: Proceedings of TENCON, vol. 3, pp. 157–161 (2000)

    Google Scholar 

  8. Leo, B.: Bagging predictors. Machine Learning 24, 123–140 (2000)

    MATH  Google Scholar 

  9. Yoav, F., Robert, E.S.: Experiments with a new boosting algorithm. In: Proceedings of International Conference on Machine Learning, pp. 148–156. Morgan Kaufmann, San Francisco (1996)

    Google Scholar 

  10. Kennedy, J., Eberhart, R.C.: Particle swarm optimization. In: Proc. IEEE Int. Conf. Neural Network IV, Perth, Australia, pp. 1942–1948 (1995)

    Google Scholar 

  11. Luo, Z.Y.: Research on intelligent fault diagnosis techniques for radar system. Xi’an College of Automation Northwestern Polytechnieal University, pp. 75–80 (2006)

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2009 Springer-Verlag Berlin Heidelberg

About this paper

Cite this paper

Zuo, L., Hou, L., Wu, W., Wang, J., Geng, S. (2009). Fault Diagnosis of Analog IC Based on Wavelet Neural Network Ensemble. In: Yu, W., He, H., Zhang, N. (eds) Advances in Neural Networks – ISNN 2009. ISNN 2009. Lecture Notes in Computer Science, vol 5553. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-01513-7_84

Download citation

  • DOI: https://doi.org/10.1007/978-3-642-01513-7_84

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-01512-0

  • Online ISBN: 978-3-642-01513-7

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics