Abstract
Available software metrics data from an initially schedule and cost-driven satellite flight software project contains a late life cycle staff spike from a lack of initial rigor in inspection and unit testing. In order to study the effects on the number of staff from varying the degree of inspection and unit test rigor, Madachy’s inspection-based system dynamics model was modified to add unit testing and an integration test feedback loop. This modified Madachy model generated a similar late life cycle manpower rate increase from a parametric lack of up-front rigor in these same defect removal techniques.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Buettner, D.J.: Designing An Optimal Software Intensive System Acquisition: A Game Theoretic Approach, Ph.D. Dissertation, Astronautics and Space Technology Division, Viterbi School of Engineering, USC, 60–100 (September 2008)
Buettner, D.J.: 4–5
Madachy, R.J.: A Software Project Dynamics Model For Process Cost, Schedule And Risk Assessment, Ph.D. Dissertation, Department of Industrial and Systems Engineering, USC, 53–58 (December 1994)
Boehm, B.W.: Software Engineering Economics, pp. 35–39. Prentice-Hall, Inc., Englewood Cliffs (1981)
Buettner, D.J.: 106–125, 289–305
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2009 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Buettner, D. (2009). A System Dynamics Model That Simulates a Significant Late Life Cycle Manpower Increase Phenomenon. In: Wang, Q., Garousi, V., Madachy, R., Pfahl, D. (eds) Trustworthy Software Development Processes. ICSP 2009. Lecture Notes in Computer Science, vol 5543. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-01680-6_36
Download citation
DOI: https://doi.org/10.1007/978-3-642-01680-6_36
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-01679-0
Online ISBN: 978-3-642-01680-6
eBook Packages: Computer ScienceComputer Science (R0)