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Impact of Process Variation in Fault-Resilient Streaming Nanoprocessors

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Nano-Net (NanoNet 2008)

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Abstract

We show results from ongoing work studying the interaction of process variation and built-in fault resilience intended to handle defects. We find that built-in fault resilience decreases the negative effects of process variation on a streaming nanoprocessor design.

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References

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Author information

Authors and Affiliations

  1. UMass Amherst, Amherst, MA, 01002, USA

    Michael Leuchtenburg, Pritish Narayanan, Teng Wang & Csaba Andras Moritz

Authors
  1. Michael Leuchtenburg
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  2. Pritish Narayanan
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  3. Teng Wang
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  4. Csaba Andras Moritz
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Editor information

Editors and Affiliations

  1. 325 Computer Science Bldg., 500 West 15th Street, MO 65409-0350, Rolla, USA

    Maggie Cheng

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© 2009 ICST Institute for Computer Science, Social Informatics and Telecommunications Engineering

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Leuchtenburg, M., Narayanan, P., Wang, T., Moritz, C.A. (2009). Impact of Process Variation in Fault-Resilient Streaming Nanoprocessors. In: Cheng, M. (eds) Nano-Net. NanoNet 2008. Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering, vol 3. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-02427-6_6

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  • DOI: https://doi.org/10.1007/978-3-642-02427-6_6

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-02426-9

  • Online ISBN: 978-3-642-02427-6

  • eBook Packages: Computer ScienceComputer Science (R0)

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