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Model-Based Testing of Electronic Passports

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Formal Methods for Industrial Critical Systems (FMICS 2009)

Part of the book series: Lecture Notes in Computer Science ((LNPSE,volume 5825))

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Introduction

Electronic passports, or e-passports for short, contain a contactless smartcard which stores digitally-signed data. To rigorously test e-passports, we developed formal models of the e-passport protocols that enable model-based testing using the TorXakis framework.

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References

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Authors and Affiliations

  1. Radboud University, Nijmegen, The Netherlands

    Wojciech Mostowski, Erik Poll, Jan Tretmans & Ronny Wichers Schreur

  2. Embedded Systems Institute (ESI), Eindhoven, The Netherlands

    Julien Schmaltz & Jan Tretmans

Authors
  1. Wojciech Mostowski
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  2. Erik Poll
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  3. Julien Schmaltz
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  4. Jan Tretmans
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  5. Ronny Wichers Schreur
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Editor information

Editors and Affiliations

  1. DSIC/ELP, Universidad Politécnica de Valencia, Camino de Vera s/n, 46022, Valencia, Spain

    María Alpuente  & Christophe Joubert  & 

  2. Microsoft Research, Roger Needham Building, J J Thomson Avenue, CB3 0FB, Cambridge, UK

    Byron Cook

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© 2009 Springer-Verlag Berlin Heidelberg

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Mostowski, W., Poll, E., Schmaltz, J., Tretmans, J., Wichers Schreur, R. (2009). Model-Based Testing of Electronic Passports. In: Alpuente, M., Cook, B., Joubert, C. (eds) Formal Methods for Industrial Critical Systems. FMICS 2009. Lecture Notes in Computer Science, vol 5825. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-04570-7_19

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  • DOI: https://doi.org/10.1007/978-3-642-04570-7_19

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-04569-1

  • Online ISBN: 978-3-642-04570-7

  • eBook Packages: Computer ScienceComputer Science (R0)

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