Accelerated life tests (ALT) are efficient industrial experiments for obtaining measures of a device reliability under the usual working conditions.
A practical problem for industries of different areas is to obtain measures of a device reliability under its usual working conditions. Typically, the time and cost of such experimentation are long and expensive. The ALT are efficient for handling such situation, since the information on the device performance under the usual working conditions are obtained by considering a time and cost-reduced experimental scheme. The ALT are performed by testing items at higher stress covariate levels than the usual working conditions, such as temperature, pressure and voltage.
There is a large literature on ALT and interested readers can refer to Mann et al. (1974), Nelson (1990), Meeker and Escobar (1998) which are excellent sources for ALT. Nelson (2005a, b) provides a brief background on accelerated testing and test plans and surveys the related...
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References and Further Reading
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Louzada-Neto, F. (2011). Accelerated Lifetime Testing. In: Lovric, M. (eds) International Encyclopedia of Statistical Science. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-04898-2_103
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