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Comparative Analysis of Wavelet-Based Scale-Invariant Feature Extraction Using Different Wavelet Bases

  • Conference paper
Signal Processing, Image Processing and Pattern Recognition (SIP 2009)

Part of the book series: Communications in Computer and Information Science ((CCIS,volume 61))

Abstract

In this paper, we present comparative analysis of scale-invariant feature extraction using different wavelet bases. The main advantage of the wavelet transform is the multi-resolution analysis. Furthermore, wavelets enable localigation in both space and frequency domains and high-frequency salient feature detection. Wavelet transforms can use various basis functions. This research aims at comparative analysis of Daubechies, Haar and Gabor wavelets for scale-invariant feature extraction. Experimental results show that Gabor wavelets outperform better than Daubechies, Haar wavelets in the sense of both objective and subjective measures.

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Author information

Authors and Affiliations

  1. Image Processing and Intelligent Systems Laboratory, Graduate School of Advanced Imaging Science, Multimedia, and Film, Chung-Ang University, 221 Heuksuk-Dong, Dongjak-Ku, Seoul, 156-756, Korea

    Joohyun Lim & Joonki Paik

  2. Intelligent Robotics Research Laboratory, Korea Electronics Technology Institute (KETI), 401-402 B/D 193, Yakdae-Dong, WonMi-Gu, Puchon-Si, KyungGi-Do, 420-140, Korea

    Youngouk Kim

Authors
  1. Joohyun Lim
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  2. Youngouk Kim
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  3. Joonki Paik
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Editor information

Editors and Affiliations

  1. University of Warsaw and Infobright Inc., Poland

    Dominik Ślęzak

  2. Indian Statistical Institute, India

    Sankar K. Pal

  3. University of Tasmania, 7001, Hobart, Australia

    Byeong-Ho Kang

  4. Lab. of Multimedia Information Technology (MMIT), East China Normal University (ECNU), P.O. Box, 200062, Shanghai, China

    Junzhong Gu

  5. Nagasaki University, Japan

    Hideo Kuroda

  6. Hannam University, 306-791, Daejeon, South Korea

    Tai-hoon Kim

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© 2009 Springer-Verlag Berlin Heidelberg

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Lim, J., Kim, Y., Paik, J. (2009). Comparative Analysis of Wavelet-Based Scale-Invariant Feature Extraction Using Different Wavelet Bases. In: Ślęzak, D., Pal, S.K., Kang, BH., Gu, J., Kuroda, H., Kim, Th. (eds) Signal Processing, Image Processing and Pattern Recognition. SIP 2009. Communications in Computer and Information Science, vol 61. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-10546-3_35

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  • DOI: https://doi.org/10.1007/978-3-642-10546-3_35

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-10545-6

  • Online ISBN: 978-3-642-10546-3

  • eBook Packages: Computer ScienceComputer Science (R0)

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