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Extending Metric Multidimensional Scaling with Bregman Divergences

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Trends in Applied Intelligent Systems (IEA/AIE 2010)

Part of the book series: Lecture Notes in Computer Science ((LNAI,volume 6097))

Abstract

We investigate multidimensional scaling with Bregman divergences and show that the Sammon mapping can be thought of as a truncated Bregman multidimensional scaling (BMDS). We show that the full BMDS improves upon the Sammon mapping on some standard data sets and investigate the reasons underlying this improvement. We then introduce two families of BMDS which use opposite strategies to create good mappings of standard data sets and investigate these opposite strategies analytically.

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References

  1. Banerjee, A., Merugu, S., Dhillon, I.S., Ghosh, J.: Clustering with Bregman divergences. J. Mach. Learn. Res. 6, 1705–1749 (2005)

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Author information

Authors and Affiliations

  1. University of the West of Scotland, UK

    Jigang Sun, Malcolm Crowe & Colin Fyfe

Authors
  1. Jigang Sun
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  2. Malcolm Crowe
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  3. Colin Fyfe
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Editor information

Editors and Affiliations

  1. Dept. of Computing and Numerical Analysis, University of Cordoba, Campus Universitario de Rabanales, Einstein Building, 3rd floor,, 14071, Cordoba, Spain

    Nicolás García-Pedrajas

  2. Dept. of Computer Science and Artificial Intelligence, ETS de Ingenierias Informática y de Telecomunicación, University of Granada, 18071, Granada, Spain

    Francisco Herrera

  3. School of Computing, University of the West of Scotland, PA1 2BE, Paisley, UK

    Colin Fyfe

  4. Dept. Computer Science and Artificial Intelligence, ETS de Ingenierias Informática y de Telecomunicación, University of Granada, 18071, Granada, Spain

    José Manuel Benítez

  5. Department of Computer Science, Texas State University-San Marcos, 601 University Drive, TX 78666-4616, San Marcos, USA

    Moonis Ali

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© 2010 Springer-Verlag Berlin Heidelberg

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Sun, J., Crowe, M., Fyfe, C. (2010). Extending Metric Multidimensional Scaling with Bregman Divergences. In: García-Pedrajas, N., Herrera, F., Fyfe, C., Benítez, J.M., Ali, M. (eds) Trends in Applied Intelligent Systems. IEA/AIE 2010. Lecture Notes in Computer Science(), vol 6097. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-13025-0_63

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  • DOI: https://doi.org/10.1007/978-3-642-13025-0_63

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-13024-3

  • Online ISBN: 978-3-642-13025-0

  • eBook Packages: Computer ScienceComputer Science (R0)

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