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Visual Patterns in Issue Tracking Data

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New Modeling Concepts for Today’s Software Processes (ICSP 2010)

Part of the book series: Lecture Notes in Computer Science ((LNPSE,volume 6195))

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Abstract

Software development teams gather valuable data about features and bugs in issue tracking systems. This information can be used to measure and improve the efficiency and effectiveness of the development process. In this paper we present an approach that harnesses the extraordinary capability of the human brain to detect visual patterns. We specify generic visual process patterns that can be found in issue tracking data. With these patterns we can analyze information about effort estimation, and the length, and sequence of problem resolution activities. In an industrial case study we apply our interactive tool to identify instances of these patterns and discuss our observations. Our approach was validated through extensive discussions with multiple project managers and developers, as well as feedback from the project review board.

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References

  1. Tufte, E.R.: Envisioning Information. Graphics Press (May 1990)

    Google Scholar 

  2. Knab, P., Pinzger, M., Fluri, B., Gall, H.C.: Interactive Views for Analyzing Problem Reports. In: ICSM 2009 Proceedings of the 25th International Conference on Software Maintenance, pp. 527–530 (2009)

    Google Scholar 

  3. Lanza, M., Ducasse, S.: Polymetric views — a lightweight visual approach to reverse engineering. IEEE Transactions on Software Engineering 29(9), 782–795 (2003)

    Article  Google Scholar 

  4. Fischer, M., Pinzger, M., Gall, H.: Populating a release history database from version control and bug tracking systems. In: Proceedings of the International Conference on Software Maintenance, Amsterdam, Netherlands, pp. 23–32. IEEE Computer Society Press, Los Alamitos (2003)

    Google Scholar 

  5. D’Ambros, M., Lanza, M., Pinzger, M.: ”a bug’s life” - visualizing a bug database. In: Proceedings of VISSOFT 2007 (4th IEEE International Workshop on Visualizing Software For Understanding and Analysis), June 2007, pp. 113–120. IEEE CS Press, Los Alamitos (2007)

    Chapter  Google Scholar 

  6. Halverson, C.A., Ellis, J.B., Danis, C., Kellogg, W.A.: Designing task visualizations to support the coordination of work in software development. In: CSCW 2006: Proceedings of the 2006 20th anniversary conference on Computer supported cooperative work, pp. 39–48. ACM, New York (2006)

    Chapter  Google Scholar 

  7. Weiss, C., Premraj, R., Zimmermann, T., Zeller, A.: How long will it take to fix this bug? In: MSR 2007: Proceedings of the Fourth International Workshop on Mining Software Repositories, Washington, DC, USA, p. 1. IEEE Computer Society, Los Alamitos (2007)

    Chapter  Google Scholar 

  8. Ko, A.J., Myers, B.A., Chau, D.H.: A linguistic analysis of how people describe software problems. In: VLHCC 2006: Proceedings of the Visual Languages and Human-Centric Computing, Washington, DC, USA, pp. 127–134. IEEE Computer Society Press, Los Alamitos (2006)

    Chapter  Google Scholar 

  9. Hooimeijer, P., Weimer, W.: Modeling bug report quality. In: ASE 2007: Proceedings of the twenty-second IEEE/ACM international conference on Automated software engineering, pp. 34–43. ACM, New York (2007)

    Chapter  Google Scholar 

  10. Anvik, J., Hiew, L., Murphy, G.C.: Who should fix this bug? In: ICSE 2006: Proceedings of the 28th international conference on Software engineering, pp. 361–370. ACM, New York (2006)

    Chapter  Google Scholar 

  11. Anvik, J., Hiew, L., Murphy, G.C.: Coping with an open bug repository. In: eclipse 2005: Proceedings of the 2005 OOPSLA workshop on Eclipse technology eXchange, pp. 35–39. ACM, New York (2005)

    Chapter  Google Scholar 

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Knab, P., Pinzger, M., Gall, H.C. (2010). Visual Patterns in Issue Tracking Data. In: Münch, J., Yang, Y., Schäfer, W. (eds) New Modeling Concepts for Today’s Software Processes. ICSP 2010. Lecture Notes in Computer Science, vol 6195. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-14347-2_20

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  • DOI: https://doi.org/10.1007/978-3-642-14347-2_20

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-14346-5

  • Online ISBN: 978-3-642-14347-2

  • eBook Packages: Computer ScienceComputer Science (R0)

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