Skip to main content
SpringerLink
Log in

Integrated and Automated Dielectric Measurement System at Millimeter Wavelengths

  • Conference paper
Advanced Intelligent Computing Theories and Applications (ICIC 2010)

Part of the book series: Communications in Computer and Information Science ((CCIS,volume 93))

Included in the following conference series:

  • 1414 Accesses

Abstract

As low loss dielectric materials have a very important application at millimeter frequencies. To obtain their dielectric properties at Ka-band and W-band, an automatic open resonator measurement system is designed and constructed. The system controls a VNA by using a computer. The system has been completed and been running successfully. Stability and measurement accuracy of the system have been verified. The automated measurement system has addressed several key technologies of how to determine precision value of cavity length and how to choose correct solution from a lot of solutions. Meanwhile, a technology of multi-frequencies measurement improves reliability of the system. Automatic measurement system improves the testing efficiency.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Log in via an institution
Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 84.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Cook, R.J.: Microwave Cavity Methods, High Frequency Dielectric Measurement, pp. 100–101. Science and Technology Press (1973)

    Google Scholar 

  2. Cullen, A.L., Yu, P.K.: The Accurate Measurement of Permittivity by Means of an Open Resonator. In: Proc. R. Soc., vol. A.325, pp. 493–509 (1971)

    Google Scholar 

  3. Ghodgaonkar, D.K., Varadan, V.V., Varadan, V.K.: Free-space Measurement of Complex Permittivity and Complex Permeability of Magnetic Materials at Microwave Frequencies. IEEE Trans., Instrum. Meas. 39, 387–394 (1990)

    Article  Google Scholar 

  4. Afsar, M.N.: Millimeter-wave Dielectric Measurement of Materials. Proc. IEEE 73(1), 131–153 (1985)

    Article  Google Scholar 

  5. Yu, P.K., Cullen, A.L.: Measurement of Permittivity by Means of an Open Resonator: I. In: Theoretical. Proc. R. Soc., vol. 380, pp. 49–71 (1982)

    Google Scholar 

  6. Komiyama, B., Kiyokawa, M., Matsui, T.: Open Resonator for Precision Dielectric Measurements in the 100 GHz Band. IEEE Trans. Microwave Theory Tech. 39, 1792–1796 (1991)

    Article  Google Scholar 

  7. Hirvonen, T., Vainikainen, M.P., Lozowski, A., Raisanen, A.V.: Measurement of Dielectrics at 100 GHz with an Open Resonator Connected to a Network Analyzer. IEEE Trans. Instrum. Meas. 45, 780–786 (1996)

    Article  Google Scholar 

  8. Afsar, M.N., Ding, H., Tourshan, K.: A New Open Resonator Technique at 60 GHz for Permittivity and Loss-Tangent Measurements of Low-Loss Materials. IEEE MTT-S Digest., 1755–1758 (1999)

    Google Scholar 

  9. Jones, R.J.: Effect of Mirror Resistivity on Loss Angle Measurements in Open Resonator. Electron. Lett. 11, 545–547 (1975)

    Article  Google Scholar 

  10. Gui, Y.F., Dou, W.B., Yin, K., Su, P.G.: Open Resonator System for Automatic and Precise Dielectric Measurement at Millimeter Wavelengths. Int. J. Infrared Milli. Waves 29, 782–791 (2008)

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Department of Electronic Information Engineering, Suzhou Vocational University, Suzhou, 215104, Jiangsu, China

    Pingang Su

  2. State Key Lab of Millimeter Wave, Southeast University, Nanjing, 210096, Jiangsu, China

    Yongfeng Gui & Wenbin Dou

Authors
  1. Pingang Su
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Yongfeng Gui
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Wenbin Dou
    View author publications

    You can also search for this author in PubMed Google Scholar

Editor information

Editors and Affiliations

  1. Institute of Intelligent Machines, Chinese Academy of Sciences, Hefei, Anhui,, China

    De-Shuang Huang

  2. School of Computing and Intelligent Systems, University of Ulster at Magee Campus, BT48 7JL, Derry, Northern Ireland, UK

    Martin McGinnity

  3. Laboratoire LITIS, Université de Rouen, 76800, Saint Etienne du Rouvray, France

    Laurent Heutte

  4. Department of Electrical and Computer Engineering, Ryerson University, Toronto, Ontario, Canada

    Xiao-Ping Zhang

Rights and permissions

Reprints and permissions

Copyright information

© 2010 Springer-Verlag Berlin Heidelberg

About this paper

Cite this paper

Su, P., Gui, Y., Dou, W. (2010). Integrated and Automated Dielectric Measurement System at Millimeter Wavelengths. In: Huang, DS., McGinnity, M., Heutte, L., Zhang, XP. (eds) Advanced Intelligent Computing Theories and Applications. ICIC 2010. Communications in Computer and Information Science, vol 93. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-14831-6_68

Download citation

  • DOI: https://doi.org/10.1007/978-3-642-14831-6_68

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-14830-9

  • Online ISBN: 978-3-642-14831-6

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics

Search

Navigation