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On the Two Factors Affecting Information Systems Success in the Extreme Event Context

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Exploring the Grand Challenges for Next Generation E-Business (WEB 2009)

Part of the book series: Lecture Notes in Business Information Processing ((LNBIP,volume 52))

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Abstract

This study examines the impact of perceived risk and organizational resilience on information systems success process in the context of hospitals. The research model was tested with the data collected from three of the hospitals in the Western New York area that were affected by a major snowstorm that was labeled as a federal disaster. The analysis and results appear. Theoretical and practical implications of this study and future research directions are discussed.

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References

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Author information

Authors and Affiliations

  1. Management and Information Systems, Montclair State University, NJ, 07043, USA

    Insu Park

  2. Management Science and Systems, SUNY Buffalo, NY, 14260, USA

    R. Sharman & H. Raghav Rao

  3. Computer Science and Engineering, SUNY Buffalo, NY, 14260, USA

    S. Upadhyaya

Authors
  1. Insu Park
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  2. R. Sharman
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  3. H. Raghav Rao
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  4. S. Upadhyaya
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Editor information

Editors and Affiliations

  1. Department of Management Science and Systems, State University of New York at Buffalo, 14260, Buffalo, New York, NY, USA

    Raj Sharman

  2. Department of Management Science and Systems, State University of New York at Buffalo, School of Management, 14260, Buffalo, New York, NY, USA

    H. Raghav Rao

  3. Department of Information Systems, Arizona State University, 601G, 874606, Tempe, AZ, USA

    T. S. Raghu

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© 2010 Springer-Verlag Berlin Heidelberg

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Park, I., Sharman, R., Raghav Rao, H., Upadhyaya, S. (2010). On the Two Factors Affecting Information Systems Success in the Extreme Event Context. In: Sharman, R., Rao, H.R., Raghu, T.S. (eds) Exploring the Grand Challenges for Next Generation E-Business. WEB 2009. Lecture Notes in Business Information Processing, vol 52. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-17449-0_18

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  • DOI: https://doi.org/10.1007/978-3-642-17449-0_18

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-17448-3

  • Online ISBN: 978-3-642-17449-0

  • eBook Packages: Computer ScienceComputer Science (R0)

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