Abstract
This work studies quality output of a production system applying simulation and analytical models. It originates in semiconductors, but can be adapted to other industries. We investigate the impact of Inspection Policies (IP) on Flow-Time (FT) and quality, as measured by Out-Of-Control (OOC). Results indicate that growing inspection rate reduces OOC and increases FT until OOC is minimized, then OOC starts to grow while FT continues to increase. Dynamic IP)s are superior to the known static IP. Maximum inspection rate or inspection utilization does not acheive minimum OOC. Operation and repair times variability affect OOC more than their statistical functions.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
P. Chandrasekhar and R. Natarajan. Confidence limits for steady state availability of systems with lognormal operating time and inverse gaussian repair time. Microelectronics Reliability, 37(6): 969–971, 1997.
A. J. Duncan. The economic design of x-charts used to maintain current control of a process. Journal of the American Statistical Association, 51(274): 228–242, 1956.
L. Haque and M. J. Armstrong. A survey of the machine interference problem. European Journal of Operational Research, 179(2): 469–482, 2007.
W. J. Hopp, M. L. Spearman, S. Chayet, K. L. Donohue, and E. S. Gel. Using an optimized queueing network model to support wafer fab design. IIE Transactions, 34: 119–130, 2002.
F. Hu and Q. Zong. Optimal production run time for a deteriorating production system under an extended inspection policy. European Journal of Operational Research, 196(3): 979–986, 2009.
T. Jin, F. Belkhouche, and C. H. Sung. A consolidated approach to minimize semiconductor production loss due to unscheduled ATE downtime. Proceedings of the 3rd Annual IEEE Conference on Automation Science and Engineering, pages 188–193, sep. 2007.
R.C. Leachman, D. Shengwei, and C. Chen-Fu. Economic efficiency analysis of wafer fabrication. IEEE Transactions on Automation Science and Engineering, 4(4): 501–512, oct. 2007.
N. Li, M. T. Zhang, S. Deng, Z. H. Lee, L. Zhang, and L. Zheng. Single-station performance evaluation and improvement in semiconductor manufacturing: A graphical approach. International Journal of Production Economics, 107(2): 397–403, 2007.
S. Mittal and P. McNally. Line defect control to maximize yields. Intel Technology Journal, 4(2), 1998.
G.E. Moore. Progress in digital integrated electronics. IEEE International Electron Devices Meeting, 21: 11–13, 1975.
D. Ouelhadj and S. Petrovic. A survey of dynamic scheduling in manufacturing systems. Journal of Scheduling, 12: 417–431, 2009.
A.K. Schoemig. On the corrupting influence of variability in semiconductor manufacturing. Proceedings of the Winter Simulation Conference Proceedings, 1: 837–842, 1999.
I. Tirkel, N. Reshef, and G. Rabinowitz. In-line inspection impact on cycle time and yield. IEEE Transactions on Semiconductor Manufacturing, 22(4): 491–498, nov. 2009.
H. Wang. A survey of maintenance policies of deteriorating systems. European Journal of Operational Research, 139(3): 469–489, 2002.
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2011 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Tirkel, I., Rabinowitz, G. (2011). Quality Performance Modeling in a Deteriorating Production System with Partially Available Inspection. In: Hu, B., Morasch, K., Pickl, S., Siegle, M. (eds) Operations Research Proceedings 2010. Operations Research Proceedings. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-20009-0_63
Download citation
DOI: https://doi.org/10.1007/978-3-642-20009-0_63
Published:
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-20008-3
Online ISBN: 978-3-642-20009-0
eBook Packages: Business and EconomicsBusiness and Management (R0)