Clustering and Analyzing Embedded Software Development Projects Data Using Self-Organizing Maps

Abstract

In this paper, we cluster and analyze data from the past embedded software development projects using self-organizing maps (SOMs)[9] that are a type of artificial neural networks that rely on unsupervised learning. The purpose of the clustering and analysis is to improve the accuracy of predicting the number of errors. A SOMproduces a low-dimensional, discretized representation of the input space of training samples; these representations are called maps. SOMs are useful for visualizing low-dimensional views of high-dimensional data, a multidimensional scaling technique. The advantages of SOMs for statistical applications are as follows: (1) data visualization, (2) information processing on association and recollection, (3) summarizing large-scale data, and (4) creating nonlinear models. To verify our approach, we perform an evaluation experiment that compares SOM classification to product type classification using Welch’s t-test for Akaike’s Information Criterion (AIC). The results indicate that the SOM classification method is more contributive than product type classification in creating estimation models, because the mean AIC of SOM classification is statistically significantly lower.