Abstract
This paper proposes a new approach to discriminate the true defect and the indefinite defect with visual distinction of the electronic board. Some classification approaches have been proposed for the limited kinds of defects and there may be some incorrect recognitions for the defect which is difficult with the visual distinction. This paper proposes the approach to reduce the incorrect recognition ratio for the defects with difficult discrimination using the margin of SVM. Real electronic board image data are tested and evaluated with the proposed approach.
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References
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© 2011 Springer-Verlag Berlin Heidelberg
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Iwahori, Y., Futamura, K., Adachi, Y. (2011). Discrimination of True Defect and Indefinite Defect with Visual Inspection Using SVM. In: König, A., Dengel, A., Hinkelmann, K., Kise, K., Howlett, R.J., Jain, L.C. (eds) Knowledge-Based and Intelligent Information and Engineering Systems. KES 2011. Lecture Notes in Computer Science(), vol 6884. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-23866-6_13
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DOI: https://doi.org/10.1007/978-3-642-23866-6_13
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-23865-9
Online ISBN: 978-3-642-23866-6
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