Abstract
The naïve Bayes and support vector machine are the typical generative and discriminative classification models respectively, which are two popular classification approaches. Few studies have been done comparing their resilience to missing data. This paper provides an experimental comparison of the naïve Bayes and support vector machine regarding the resilience to missing data on 24 UCI data sets. The experimental results show that when the missing rate is very small (e.g. 1%), the resilience of the naïve Bayes classifiers to missing data are approximately similar to that of support vector machine classifiers. With the increase of the missing rate, however, the resilience of the naïve Bayes classifiers to missing data are slowly decreased and that of support vector machine classifiers to missing data are rapidly decreased. This demonstrates that the naïve Bayes classifiers have better resilience to missing data than support vector machine classifiers.
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© 2011 Springer-Verlag Berlin Heidelberg
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Shi, H., Liu, Y. (2011). Naïve Bayes vs. Support Vector Machine: Resilience to Missing Data. In: Deng, H., Miao, D., Lei, J., Wang, F.L. (eds) Artificial Intelligence and Computational Intelligence. AICI 2011. Lecture Notes in Computer Science(), vol 7003. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-23887-1_86
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DOI: https://doi.org/10.1007/978-3-642-23887-1_86
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-23886-4
Online ISBN: 978-3-642-23887-1
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