Abstract
The demands on the random sequences used in trusted computing environment are stricter than other applications. In practice, we usually produce these sequences using pseudorandom number generators, whose deterministic may cause certain security flaws. So there are various statistical tests to examine the quality of random sequences. NIST proposed a test suite containing 15 tests, which is widely used now. It is meaningful to give an overall comparison among these tests. There are two open problems mentioned by NIST for the requirements of a statistical test suite [13]: how to determine the independence and the coverage of a test suite. These two concepts are abstract and hard to measure. In this paper, we use the conditional entropy to construct a quantitative value for comparing the tests, partly solving these two problems. The result also shows the reasonableness of this approach. Also, we propose a basic method on how to determine the tests’ optimal execution order. With this order we can eliminate the non-random sequences after running the least number of tests in the average case. We show such an order under specific parameters. An interesting finding is that these two different approaches have a high similarity in the ranking of these tests.
This work is supported by the National Nature Science Foundation of China (Grant No. 60573032, 60773092, 61073149), the ministry of educationś doctor foundation (20090073110027) and the 13th PRP of Shanghai Jiao Tong University.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Similar content being viewed by others
References
Menezes, A.J., Van Oorschot, P.C., Vanstone, S.A.: Handbook of applied crytography (1997)
Rukhin, A., Soto, J.: A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications (2000)
Rukhin, A.: Approximate Entropy for Testing Randomness. Journal of Applied Probability 37(1), 88–100 (2000)
Preneel, B.: NESSIE: A European Approach to evaluate. Cryptographic Algorithms
Ryabko, B.Y.B., Monare, V.A.: Using Information Theory Approach to Randomness Testing (2004)
Ryabko, B.Y.B., Stognienko, V.S., Shokin, Y.I.: A New Test for Randomness and its Application to Some Cryptographic Problems (2004)
Shannon, C.E.: Communication Theory of Secrecy System, Bell System Technical Journal (1949)
Knuth, D.: The Art of Computer Programming Seminumerical Algorithms, 3rd edn. Addison-Wesley, Reading (1997)
Marsaglia, G.: The Marsaglia Random Number CDROM including the Diehard Battery of Tests of Randomness (1995)
Gustafsona, H., Dawson, E.P., Nielsenb, L., Caellib, W.: A Computer Package for Measuring the Strength of Encryption Algorithms (1994)
Gustafsona, H., Dawson, E.P., Golic, J.: Randomness Measures Related to Subset Occurrence (1996)
Coron, J., Naccache, D.: An Accurate Evaluation of Maurer’s Universal Test (1999)
Soto, J.: Statistical Testing of Random Number Generators, http://www.citeseerx.ist.psu.edu/viewdoc/download?doi=10.1.1.33.7905&rep=rep1&type=pdf
Soto, J.: Randomness Testing of the AES Candidate Algorithms (2000)
Turan, M.S.: On Independence and Sensitivity of Statistical Randomness Tests (2008)
Hellekalek, P., Wegenkittl, S.: Empirical Evidence Concerning. In: AES (April 2003)
L’Ecuyer, P., Simard, R.: TestU01: A C Library for Empirical Testing and Random Number Generators
Wegenkittl, S.: Entropy Estimators and Serical Tests for Ergodic Chains
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2011 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Huang, J., Lai, X. (2011). Measuring Random Tests by Conditional Entropy and Optimal Execution Order. In: Chen, L., Yung, M. (eds) Trusted Systems. INTRUST 2010. Lecture Notes in Computer Science, vol 6802. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-25283-9_10
Download citation
DOI: https://doi.org/10.1007/978-3-642-25283-9_10
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-25282-2
Online ISBN: 978-3-642-25283-9
eBook Packages: Computer ScienceComputer Science (R0)