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Part of the book series: Lecture Notes in Computer Science ((LNAI,volume 6839))

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Abstract

In iris recognition systems how to represent texture pattern is an important issue. The paper proposes a novel approach based on SIFT for feature representation of iris texture. This approach partitions a normalized iris image into non-overlapping small sub-images and uses SIFT descriptor for representing the characteristics of each sub-image. As such the iris texture pattern is represented by an ordered-set of SIFT descriptors. This representation is very distinctive and insensitive to illumination changes. In addition, it encodes the positional information of iris texture pattern. For iris matching we use Bhattacharyya distance to measure the dissimilarity between two SIFT descriptors. The final distance is a sum of the distances of the corresponding pairs of SIFT descriptors in two iris images. The experimental results on UBIRIS.v1 and UBIRIS.v2 show that proposed method has promising performance.

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Liu, X., Li, P. (2012). An Iris Recognition Approach with SIFT Descriptors. In: Huang, DS., Gan, Y., Gupta, P., Gromiha, M.M. (eds) Advanced Intelligent Computing Theories and Applications. With Aspects of Artificial Intelligence. ICIC 2011. Lecture Notes in Computer Science(), vol 6839. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-25944-9_55

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  • DOI: https://doi.org/10.1007/978-3-642-25944-9_55

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-25943-2

  • Online ISBN: 978-3-642-25944-9

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