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Automated Test-Trace Inspection for Microcontroller Binary Code

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Runtime Verification (RV 2011)

Part of the book series: Lecture Notes in Computer Science ((LNPSE,volume 7186))

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Abstract

This paper presents a non-intrusive framework for runtime verification of executable microcontroller code. A dedicated hardware unit is attached to a microcontroller, which executes the program under scrutiny, to track atomic propositions stated as assertions over program variables. The truth verdicts over the assertions are the inputs to a custom-designed μCPU unit that evaluates past-time LTL specifications in parallel to program execution. To achieve this, the instruction set of the μCPU is tailored to determining satisfaction of specifications.

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References

  1. Belinfante, A., Frantzen, L., Schallhart, C.: 14 Tools for Test Case Generation. In: Broy, M., Jonsson, B., Katoen, J.-P., Leucker, M., Pretschner, A. (eds.) Model-Based Testing of Reactive Systems. LNCS, vol. 3472, pp. 391–438. Springer, Heidelberg (2005)

    Chapter  Google Scholar 

  2. Chen, F., Roşu, G.: MOP: An efficient and generic runtime verification framework. In: OOPSLA, pp. 569–588. ACM (2007)

    Google Scholar 

  3. Drusinsky, D.: The Temporal Rover and the ATG Rover. In: Havelund, K., Penix, J., Visser, W. (eds.) SPIN 2000. LNCS, vol. 1885, pp. 323–330. Springer, Heidelberg (2000)

    Chapter  Google Scholar 

  4. Emerson, E.A.: Temporal and modal logic. In: Handbook of Theoretical Computer Science, vol. B, pp. 995–1072. MIT Press (1990)

    Google Scholar 

  5. Havelund, K., Roşu, G.: An Overview of the Runtime Verification Tool Java PathExplorer. Form. Methods Syst. Des. 24(2), 189–215 (2004)

    Article  MATH  Google Scholar 

  6. Havelund, K.: Runtime Verification of C Programs. In: Suzuki, K., Higashino, T., Ulrich, A., Hasegawa, T. (eds.) TestCom/FATES 2008. LNCS, vol. 5047, pp. 7–22. Springer, Heidelberg (2008)

    Chapter  Google Scholar 

  7. Havelund, K., Roşu, G.: Synthesizing Monitors for Safety Properties. In: Katoen, J.-P., Stevens, P. (eds.) TACAS 2002. LNCS, vol. 2280, pp. 342–356. Springer, Heidelberg (2002)

    Chapter  Google Scholar 

  8. Reinbacher, T., Brauer, J., Horauer, M., Steininger, A., Kowalewski, S.: Past Time LTL Runtime Verification for Microcontroller Binary Code. In: Salaün, G., Schätz, B. (eds.) FMICS 2011. LNCS, vol. 6959, pp. 37–51. Springer, Heidelberg (2011)

    Chapter  Google Scholar 

  9. Tsai, J.J.P., Fang, K.Y., Chen, H.Y., Bi, Y.D.: A Noninterference Monitoring and Replay Mechanism for Real-Time Software Testing and Debugging. IEEE Trans. Softw. Eng. 16, 897–916 (1990)

    Article  Google Scholar 

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Author information

Authors and Affiliations

  1. Embedded Computing Systems Group, Vienna University of Technology, Austria

    Thomas Reinbacher, Daniel Schachinger & Andreas Steininger

  2. Embedded Software Laboratory, RWTH Aachen University, Germany

    Jörg Brauer & Stefan Kowalewski

Authors
  1. Thomas Reinbacher
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  2. Jörg Brauer
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  3. Daniel Schachinger
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  4. Andreas Steininger
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  5. Stefan Kowalewski
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Editor information

Editors and Affiliations

  1. Electrical and Computer Engineering, The University of Texas at Austin, 1 University Station C5000, 78712-0240, Austin, TX, USA

    Sarfraz Khurshid

  2. University of California, 581 Soda Hall #1776, 94720-1776, Berkeley, CA, USA

    Koushik Sen

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© 2012 Springer-Verlag Berlin Heidelberg

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Reinbacher, T., Brauer, J., Schachinger, D., Steininger, A., Kowalewski, S. (2012). Automated Test-Trace Inspection for Microcontroller Binary Code. In: Khurshid, S., Sen, K. (eds) Runtime Verification. RV 2011. Lecture Notes in Computer Science, vol 7186. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-29860-8_18

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  • DOI: https://doi.org/10.1007/978-3-642-29860-8_18

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-29859-2

  • Online ISBN: 978-3-642-29860-8

  • eBook Packages: Computer ScienceComputer Science (R0)

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