Abstract
In order to support test suite understanding, we investigate whether we can automatically derive relations between test cases. In particular, we search for trace-based similarities between (high-level) end-to-end tests on the one hand and fine grained unit tests on the other. Our approach uses the shared word count metric to determine similarity. We evaluate our approach in two case studies and show which relations between end-to-end and unit tests are found by our approach, and how this information can be used to support test suite understanding.
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References
Binder, R.V.: Testing Object-Oriented Systems: Models, Patterns, and Tools. Addison-Wesley Professional (October 1999)
Cornelissen, B., van Deursen, A., Moonen, L., Zaidman, A.: Visualizing testsuites to aid in software understanding. In: Proc. of the European Conference on Software Maintenance and Reengineering (CSMR), pp. 213–222. IEEE CS (2007)
Cornelissen, B., Moonen, L., Zaidman, A.: An assessment methodology for trace reduction techniques. In: Proc. Int’l Conf. Software Maintenance (ICSM), pp. 107–116. IEEE CS (2008)
Cornelissen, B., Zaidman, A., van Deursen, A., Moonen, L., Koschke, R.: A systematic survey of program comprehension through dynamic analysis. IEEE Transactions on Software Engineering 35(5), 684–702 (2009)
van Deursen, A., Moonen, L., van Den Bergh, A., Kok, G.: Refactoring test code. In: Extreme Programming Perspectives, pp. 141–152. Addison Wesley (2002)
Freeman, S., Pryce, N.: Growing Object-Oriented Software, Guided by Tests, 1st edn. Addison-Wesley Professional (2009)
Galli, M., Lanza, M., Nierstrasz, O., Wuyts, R.: Ordering broken unit tests for focused debugging. In: Int’l Conf. Softw. Maintenance (ICSM), pp. 114–123. IEEE (2004)
Greiler, M., Groß, H.G., van Deursen, A.: Understanding plug-in test suites from an extensibility perspective. In: Proceedings Working Conference on Reverse Engineering (WCRE), pp. 67–76. IEEE CS (2010)
Hurdugaci, V., Zaidman, A.: Aiding developers to maintain developer tests. In: Conf. Softw. Maintenance and Reengineering (CSMR), pp. 11–20. IEEE CS (2012)
Meszaros, G.: xUnit Test Patterns: Refactoring Test Code. Addison-Wesley (2007)
Rothermel, G., Harrold, M.: Empirical studies of a safe regression test selection technique. IEEE Transactions on Software Engineering 24(6), 401–419 (1998)
Stephen, G.A.: String searching algorithms. World Scientific Publishing Co. (1994)
Van Rompaey, B., Du Bois, B., Demeyer, S., Rieger, M.: On the detection of test smells: A metrics-based approach for general fixture and eager test. IEEE Transactions on Software Engineering 33(12), 800–817 (2007)
Weiss, S., Indurkhya, N., Zhang, T., Damerau, F.: Text Mining: Predictive Methods for Analyzing Unstructured Information. Springer (2004)
Yoo, S., Harman, M., Tonella, P., Susi, A.: Clustering test cases to achieve effective and scalable prioritisation incorporating expert knowledge. In: Proceedings of the Eighteenth International Symposium on Software Testing and Analysis, ISSTA 2009, pp. 201–212. ACM, New York (2009)
Zaidman, A., Van Rompaey, B., van Deursen, A., Demeyer, S.: Studying the co-evolution of production and test code in open source and industrial developer test processes through repository mining. Empir. Softw. Eng. 16(3), 325–364 (2011)
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Greiler, M., van Deursen, A., Zaidman, A. (2012). Measuring Test Case Similarity to Support Test Suite Understanding. In: Furia, C.A., Nanz, S. (eds) Objects, Models, Components, Patterns. TOOLS 2012. Lecture Notes in Computer Science, vol 7304. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-30561-0_8
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DOI: https://doi.org/10.1007/978-3-642-30561-0_8
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