Abstract
This paper presents a new robust face recognition technique based on the extraction and matching of Wavelet-SIFT features from individual face images. Here, Biorthogonal wavelet 4.4 is employed as the basis for Discrete Wavelet Transform of the images. Then, SIFT Face recognition method is applied on LL and HH sub band combination of images for recognition. The results obtained with the proposed method are compared with basic SIFT face recognition and classic appearance based face recognition technique (PCA) over three face databases: Nottingham database, Aberdeen database and Iranian database.
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Mani Kumar, N.A., Sathidevi, P.S. (2013). Wavelet SIFT Feature Descriptors for Robust Face Recognition. In: Meghanathan, N., Nagamalai, D., Chaki, N. (eds) Advances in Computing and Information Technology. Advances in Intelligent Systems and Computing, vol 177. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-31552-7_87
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DOI: https://doi.org/10.1007/978-3-642-31552-7_87
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-31551-0
Online ISBN: 978-3-642-31552-7
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