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A Resistance Deviation-To-Time Interval Converter Using Second Generation Current Conveyors

  • Conference paper
Computer Applications for Communication, Networking, and Digital Contents (FGCN 2012)

Part of the book series: Communications in Computer and Information Science ((CCIS,volume 350))

Abstract

A resistance deviation-to-time interval converter using second generation current conveyors is designed for connecting resistive bridge sensors with a digital system based on dual-slope integration. Simulation results exhibit that a conversion sensitivity amounts to 15.56 μs/Ω over the resistance deviation range of 0-200 Ω and its linearity error is less than ±0.02%. Its temperature stability is less than 220 ppm/℃ in the temperature range of −25-85℃.

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References

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Author information

Authors and Affiliations

  1. Department of Semiconductor Engineering, Cheongju University, Cheongju, 360-764, Korea

    Han-Seul Kim, Jae-Gyu Shin, Won-Sup Chung & Sang-Hee Son

Authors
  1. Han-Seul Kim
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  2. Jae-Gyu Shin
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  3. Won-Sup Chung
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  4. Sang-Hee Son
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Editor information

Editors and Affiliations

  1. GVSA and University of Tasmania, Hobart, TAS, Australia

    Tai-hoon Kim

  2. Mokwon University, Daejeon, Korea

    Dae-sik Ko

  3. University of Western Macedonia, Kozani, Greece

    Thanos Vasilakos

  4. Jet Propulsion Laboratory/Caltech, NASA, 4800 Oak Grove Drive, 91109, Pasadena, CA, USA

    Adrian Stoica

  5. Deakin University, 75 Pigdons Road, 3216, Waurn Ponds, VIC, Australia

    Jemal Abawajy

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© 2012 Springer-Verlag Berlin Heidelberg

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Kim, HS., Shin, JG., Chung, WS., Son, SH. (2012). A Resistance Deviation-To-Time Interval Converter Using Second Generation Current Conveyors. In: Kim, Th., Ko, Ds., Vasilakos, T., Stoica, A., Abawajy, J. (eds) Computer Applications for Communication, Networking, and Digital Contents. FGCN 2012. Communications in Computer and Information Science, vol 350. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-35594-3_18

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  • DOI: https://doi.org/10.1007/978-3-642-35594-3_18

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-35593-6

  • Online ISBN: 978-3-642-35594-3

  • eBook Packages: Computer ScienceComputer Science (R0)

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