Abstract
This paper presents a robust and simple metric approach named Force Work Induced Metric (FWIM) according to a Physical model. A novel image local descriptor based on FWIM (FWIM-LD) is then introduced for face verification. FWIM-LD captures the local structure information between central pixel and its neighbors effectively. PCA thus is used to obtain the low-dimensional and significant features. Subsequently, we employ the binary-like face representation method to further improve the face verification rate. Experimental results on the challenging benchmark “Labeled Faces in the Wild” (LFW) dataset demonstrate that the proposed method achieves better performance than the state-of-the-art algorithms.
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Guillaumin, M., Verbeek, J., Schmid, C.: Is that you? Metric Learning Approaches for Face Identification. In: 12th IEEE International Conference on Computer Vision, Kyoto, Japan, pp. 498–505 (2009)
Hua, G., Akbarzadeh, A.: A Robust Elastic and Partial Matching Metric for Face Recognition. In: 12th IEEE International Conference on Computer Vision, Kyoto, Japan, pp. 2082–2089 (2009)
Pinto, N., DiCarlo, J.J., Cox, D.D.: How far can you get with a modern face recognition test set using only simple features? In: IEEE-Computer-Society Conference on Computer Vision and Pattern Recognition Workshops, Miami Beach, FL, pp. 2583–2590 (2009)
Cao, Z., Yin, Q., Tang, X., Sun, J.: Face Recognition with Learning-based Descriptor. In: 23rd IEEE Conference on Computer Vision and Pattern Recognition (CVPR), San Francisco, CA, pp. 2707–2714 (2010)
Ahonen, T., Hadid, A., Pietikainen, M.: Face description with local binary patterns: Application to face recognition. IEEE Transactions on Pattern Analysis and Machine Intelligence 28, 2037–2041 (2006)
Ojala, T., Pietikainen, M., Maenpaa, T.: Multiresolution gray-scale and rotation invariant texture classification with local binary patterns. IEEE Transactions on Pattern Analysis and Machine Intelligence 24, 971–987 (2002)
Wolf, L., Hassner, T., Taigman, Y.: Effective Unconstrained Face Recognition by Combining Multiple Descriptors and Learned Background Statistics. IEEE Transactions on Pattern Analysis and Machine Intelligence 33, 1978–1990 (2011)
Tan, X.Y., Triggs, B.: Enhanced Local Texture Feature Sets for Face Recognition Under Difficult Lighting Conditions. IEEE Transactions on Image Processing 19, 1635–1650 (2010)
Lei, Z., Liao, S.C., Pietikainen, M., Li, S.Z.: Face Recognition by Exploring Information Jointly in Space, Scale and Orientation. IEEE Transactions on Image Processing 20, 247–256 (2011)
Seo, H.J., Milanfar, P.: Training-Free, Generic Object Detection Using Locally Adaptive Regression Kernels. IEEE Transactions on Pattern Analysis and Machine Intelligence 32, 1688–1704 (2010)
Seo, H.J., Milanfar, P.: Face Verification Using the LARK Representation. IEEE Transactions on Information Forensics and Security 6, 1275–1286 (2011)
Kavukcuoglu, K., Ranzato, M.A., Fergus, R., Le Cun, Y.: Learning Invariant Features through Topographic Filter Maps. In: IEEE-Computer-Society Conference on Computer Vision and Pattern Recognition Workshops, Miami Beach, FL, pp. 1605–1612 (2009)
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Qian, J., Yang, J., Yang, Z., Wang, W. (2013). Force Work Induced Metric for Face Verification. In: Yang, J., Fang, F., Sun, C. (eds) Intelligent Science and Intelligent Data Engineering. IScIDE 2012. Lecture Notes in Computer Science, vol 7751. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-36669-7_37
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DOI: https://doi.org/10.1007/978-3-642-36669-7_37
Publisher Name: Springer, Berlin, Heidelberg
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