Abstract
The fault-tolerant evolutionary design based on negative-correlation redundancy technique is an effective way to improve the fault-tolerance of analog circuits with uncertain faults. In the existing negative-correlation redundancy evolutionary framework (ENCF), the negative-correlation penalty coefficient plays an important role, and it affects the performance of ENCF greatly. However, the value of the negative-correlation penalty coefficient is heavily dependent on the experience of designers. In this paper, we propose a new negative-correlation redundancy evolutionary framework based on stochastic ranking strategy. In order to make comparisons with the existing researches, we employ analog filter as a design example. Experimental results show that the framework proposed in this paper can generate negatively correlated redundancies without specifying the penalty coefficient, and it shows a relatively high ability to convergence compared to ENCF.
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References
Schnier, T., Yao, X.: Using Negative Correlation to Evolve Fault-Tolerant Circuits. In: Proceedings of the 5th International Conference on Evolvable Systems, pp. 35–46 (2003)
Liu, M., He, J.: Negatively-Correlated Redundancy Circuits Evolution: A New Way of Robust Analog Circuit Synthesizing. In: Third International Workshop on Advanced Computational Intelligence, Suzhou, Jiangsu, China, August 25-27 (2010)
Liu, M., He, J.: An Evolutionary Negative-Correlation Framework for Robust Analog-Circuit Design under Uncertain Faults. IEEE Transactions on Evolutionary Computation (2012)
Liu, M.: Analog circuits evolution design and the study of negative-correlation evolutionary framework for fault tolerant of analog circuits. Science and Technology University of Science and Technology of China, Anhui (2012)
Kim, K.-J., Wong, A., Lipson, H.: Automated synthesis of resilient and tamper-evident analog circuits without a single point of failure. Genet Program Evolvable Mac 11(2010), 34–59 (2010)
Kim, K.-J., Chob, S.-J.: Automated synthesis of multiple analog circuits using evolutionary computation for redundancy-based fault-tolerance. Applied Soft Computing 12(4), 1309–1321 (2012)
Chang, H., He, J.: Structure diversity design of analog circuits by evolution computation for fault-tolerance. In: 2012 International Conference on Systems and informatics (2012)
Runarsson, T.P., Yao, X.: Stochastic Ranking for Constrained Evolutionary Optimization. IEEE Transactions on evolutionary computation 4(3) (2012)
Liu, Y., Yao, X.: Ensemble Learning Via Negative Correlation. Neural Networks 12, 1399–1404 (1999)
Liu, Y., Yao, X., Higuchi, T.: Evolutionary Ensembles with Negative Correlation Learning. IEEE Transactions on Evolutionary Computation 4(4), 380–387 (1999)
Lohn, J.D., Colonbano, S.P.: A Circuit Representation Techniques for Automated Circuit Design. IEEE Transactions on Automatic Control 3(3), 205–219 (1999)
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Lin, C., He, J. (2013). A Novel Negative-Correlation Redundancy Evolutionary Framework Based on Stochastic Ranking for Fault-Tolerant Design of Analog Circuit. In: Tan, Y., Shi, Y., Mo, H. (eds) Advances in Swarm Intelligence. ICSI 2013. Lecture Notes in Computer Science, vol 7928. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-38703-6_65
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DOI: https://doi.org/10.1007/978-3-642-38703-6_65
Publisher Name: Springer, Berlin, Heidelberg
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