Abstract
The principle of random testing is to apply a sequence of random input patterns simultaneously to both a circuit under test and a reference circuit. The outputs are compared. The research aim is to determine the test length (number of input patterns to apply) to obtain a given test quality. In the case of the microprocessor one applies a sequence of random instructions with random data, and a method of evaluating an upper bound for a detecting sequence has been defined in previous works. This paper recalls the method and concerns extensions to use it for LSI circuits which are not microprocessors. One gives results (test lengths) for three LSI self-checking circuits and more general comments about random testing of self-checking circuits. Some experimental results are presented in a summary form.
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© 1984 Springer-Verlag Berlin Heidelberg
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Deneux, H., Thevenod-Fosse, P. (1984). Random Testing of LSI Self-Checking Circuits. In: Großpietsch, KE., Dal Cin, M. (eds) Fehlertolerierende Rechensysteme. Informatik-Fachberichte, vol 84. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-69698-5_31
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DOI: https://doi.org/10.1007/978-3-642-69698-5_31
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