Abstract
The growing importance of fault-tolerance for computing systems has made self-diagnosis a topic of considerable interest, since efficient self-diagnosis is a prerequisite for any fault-tolerant system behavior. In this paper, self-diagnosis of systems with multiple processing elements is considered where each element may enter into the diagnosis of other elements. We shall develop a formal model for self-diagnosis based on comparison testing. In particular, we consider tree machines suitable for VLSI-implementation.
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© 1981 Springer-Verlag Berlin Heidelberg
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Dal Cin, M. (1981). Self-Diagnosis for Parallel Computers. In: Brauer, W. (eds) GI — 11. Jahrestagung. Informatik-Fachberichte, vol 50. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-01089-1_26
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DOI: https://doi.org/10.1007/978-3-662-01089-1_26
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-10884-9
Online ISBN: 978-3-662-01089-1
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