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A Multi-dimensional Model for Computer-Aided Measuring Planning (CAMP) in Digital Manufacturing

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Knowledge Discovery, Knowledge Engineering and Knowledge Management (IC3K 2013)

Part of the book series: Communications in Computer and Information Science ((CCIS,volume 454))

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Abstract

Measuring process based on laser tracker, iGPS and other digital measurement instruments becomes more and more important in digital manufacturing. Traditionally, a measuring process is planned based on human knowledge in planning strategies, measuring regulations, instruments, measuring operations and historical data. Relatively, computer aided measuring planning (CAMP) makes the process formatted, and enables manufacturers to improve measurement accuracy and efficiency and reduce the cost. To implement CAMP for digital measuring process, the concept of general measurement space (GMS) is proposed, and a multi-dimensional model (MDM) is built to support the structural storing and handling of the key information for measuring process. The model has multi attributes in three dimensions, which describe and classify multi-source and heterogeneous data related to a measuring process. Finally, the GMS’s characteristics matrix is constructed, providing a feasible way to evaluate measurement plans based on measuring process knowledge.

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Authors and Affiliations

  1. School of Mechanical Engineering and Automation, Beihang University, Beijing, China

    Xiaoqing Tang & Zhehan Chen

Authors
  1. Xiaoqing Tang
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  2. Zhehan Chen
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Corresponding author

Correspondence to Zhehan Chen .

Editor information

Editors and Affiliations

  1. Technical University of Lisbon, Lisbon, Portugal

    Ana Fred

  2. Faculty of Electrical Engineering, Mathematics and Computer Science, Delft University of Technology, Delft, The Netherlands

    Jan L.G. Dietz

  3. Henley Business School, University of Reading, Reading, United Kingdom

    Kecheng Liu

  4. INSTICC, Setubal, Portugal

    Joaquim Filipe

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Tang, X., Chen, Z. (2015). A Multi-dimensional Model for Computer-Aided Measuring Planning (CAMP) in Digital Manufacturing. In: Fred, A., Dietz, J., Liu, K., Filipe, J. (eds) Knowledge Discovery, Knowledge Engineering and Knowledge Management. IC3K 2013. Communications in Computer and Information Science, vol 454. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-46549-3_4

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  • DOI: https://doi.org/10.1007/978-3-662-46549-3_4

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-46548-6

  • Online ISBN: 978-3-662-46549-3

  • eBook Packages: Computer ScienceComputer Science (R0)

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