Abstract
Timed usage models (TUMs) represent a model-based statistical approach for system testing of real-time embedded systems. They enable an automatic test case generation and the calculation of parameters that aid the test process. However, a classical TUM only supports sequential uses of the system under test (SUT). It is not capable of dealing with concurrency, which is required for state of the art real-time embedded systems. Therefore, we introduce TUMs with parallel regions. They also allow automatic test case generation, which is carried out similarly to classical TUMs. But, the semi-Markov process (SMP) that is usually used for analysis is not suitable here. We apply Markov renewal theory and define an SMP with parallel regions, which is used to calculate parameters. We validated our analytical approach by simulations.
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Notes
- 1.
Time Partition Testing: Systematic automated testing of embedded systems, http://www.piketec.com, accessed on May 22, 2015.
- 2.
Papyrus: Graphical editing tool for UML 2, http://www.eclipse.org/modeling/mdt/papyrus, accessed on May 22, 2015.
- 3.
OMNeT++: An object-oriented modular discrete event network simulation framework, http://www.omnetpp.org, accessed on May 22, 2015.
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Homm, D., Eckert, J., German, R. (2015). Combining Time and Concurrency in Model-Based Statistical Testing of Embedded Real-Time Systems. In: Bianculli, D., Calinescu, R., Rumpe, B. (eds) Software Engineering and Formal Methods. SEFM 2015. Lecture Notes in Computer Science(), vol 9509. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-49224-6_3
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DOI: https://doi.org/10.1007/978-3-662-49224-6_3
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