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Randomness Testing: Result Interpretation and Speed

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The New Codebreakers

Part of the book series: Lecture Notes in Computer Science ((LNSC,volume 9100))

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Abstract

In cryptography, randomness is typically tested using a battery of tests consisting of many tests of randomness – each focusing on a different feature. Probability that data produced by a good generator would pass all the tests in a battery can get quite small for a large number of used tests. Therefore, results of many tests should be interpreted with a particular focus on this issue. We argue for the Šidák correction – this is a statistical method that can be used for evaluating multiple but independent tests. We analyzed the accuracy of the Šidák correction since tests of randomness are usually correlated, and we undertook this analysis for the NIST Statistical Test Suite. Results show that correlation of tests of randomness has got only a marginal influence on the accuracy of the Šidák correction. We also provide a speed-optimized version of NIST STS that achieved test results more than 30-times faster than the original NIST codes.

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References

  1. Rukhin, A., Soto, J., Nechvatal, J., Smid, M., Barker, E., Leigh, S., Levenson, M., Vangel, M., Banks, D., Heckert, A., Dray, J., Vo, S.: A statistical test suite for the validation of random number generators and pseudo random number generators for cryptographic applications, Version STS-2.1. In: NIST Special Publication 800–22rev1a. http://csrc.nist.gov/publications/nistpubs/800-22-rev1a/SP800-22rev1a.pdf

  2. Brown, R.G.: Dieharder: A random number test suite, Version 3.31.1 (2004)

    Google Scholar 

  3. L’Ecuyer, P., Simard, R.: TestU01: A C library for empirical testing of random number generators. ACM Trans. Math. Softw. 33(4), Article 22 (2007)

    Google Scholar 

  4. Doganaksoy, A., Ege, B., Mus, K.: Extended results for independence and sensitivity of NIST randomness tests. In: (3rd) Information Security and Cryptography Conference, Turkey (2008)

    Google Scholar 

  5. Nano-Optics groups at the Department of Physics of Humboldt University and PicoQuant GmbH: QRNG Service. https://qrng.physik.hu-berlin.de

  6. Sýs, M., Říha, Z.: Faster randomness testing with the nist statistical test suite. In: Chakraborty, R.S., Matyas, V., Schaumont, P. (eds.) SPACE 2014. LNCS, vol. 8804, pp. 272–284. Springer, Heidelberg (2014)

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  7. Sýs, M., Říha, Z.: Optimised implementation of NIST STS (2014). https://github.com/sysox/NIST-STS-optimised

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Correspondence to Vashek Matyáš .

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Sýs, M., Matyáš, V. (2016). Randomness Testing: Result Interpretation and Speed. In: Ryan, P., Naccache, D., Quisquater, JJ. (eds) The New Codebreakers. Lecture Notes in Computer Science(), vol 9100. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-49301-4_24

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  • DOI: https://doi.org/10.1007/978-3-662-49301-4_24

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-49300-7

  • Online ISBN: 978-3-662-49301-4

  • eBook Packages: Computer ScienceComputer Science (R0)

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