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Test Data Generation for Mutation Testing Using Genetic Algorithm

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Soft Computing for Problem Solving

Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 817))

Abstract

Mutation testing is a fault-based unit testing in which faults are detected by executing certain test data designed by any white box testing technique. This paper presents a hybridized method for path testing as well as mutation testing by generating the test data automatically using genetic algorithm. In the proposed approach, first path coverage-based test data is generated and further this data is exercised to cover all mutants present in the specific program under test. The proposed method can improve the testing efficiency by deleting the redundant test data obtained from the path testing in terms of better mutation score, and fault detection matrix is used to delete the duplicate data covering same mutants.

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Author information

Authors and Affiliations

  1. School of Computer Engineering, KIIT University, Bhubaneswar, 751024, India

    Deepti Bala Mishra & Arup Abhinna Acharya

  2. School of Applied Sciences, KIIT University, Bhubaneswar, 751024, India

    Rajashree Mishra

  3. Department of Mathematics, National Institute of Technology, Silchar, Silchar, 788010, Assam, India

    Kedar Nath Das

Authors
  1. Deepti Bala Mishra
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  2. Rajashree Mishra
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  3. Arup Abhinna Acharya
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  4. Kedar Nath Das
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Corresponding author

Correspondence to Rajashree Mishra .

Editor information

Editors and Affiliations

  1. Department of Mathematics, South Asian University, New Delhi, India

    Jagdish Chand Bansal

  2. Department of Mathematics, National Institute of Technology Silchar, Silchar, Assam, India

    Kedar Nath Das

  3. Department of Mathematics and Computer Science, Faculty of Science, Liverpool Hope University, Liverpool, UK

    Atulya Nagar

  4. Department of Mathematics, Indian Institute of Technology Roorkee, Roorkee, Uttarakhand, India

    Kusum Deep

  5. School of Basic Sciences, Indian Institute of Technology Bhubaneswar, Bhubaneswar, Odisha, India

    Akshay Kumar Ojha

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Mishra, D.B., Mishra, R., Acharya, A.A., Das, K.N. (2019). Test Data Generation for Mutation Testing Using Genetic Algorithm. In: Bansal, J., Das, K., Nagar, A., Deep, K., Ojha, A. (eds) Soft Computing for Problem Solving. Advances in Intelligent Systems and Computing, vol 817. Springer, Singapore. https://doi.org/10.1007/978-981-13-1595-4_68

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