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Design of Optimal Bayesian Reliability Test Plans for a Parallel System Based on Type-II Censoring

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Proceedings of the Sixth International Conference on Mathematics and Computing

Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 1262))

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Abstract

Consider a parallel system with n independent components. Assume that the lifetime of ith component follows an exponential distribution with unknown parameter. We assume that each failure rate is distinct and the priori information can be modeled by quasi-density function. Using squared error loss function, a Bayesian estimator for failure rate based on type-II censoring is used to get an estimate of system reliability. An optimal reliability test plan is designed and a non-linear integer optimization problem is formulated satisfying usual probability requirements (type-I and type-II error constraints). Several numerical examples are considered to illustrate the Bayesian approach of obtaining optimal reliability test plan for a parallel system.

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References

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Author information

Authors and Affiliations

  1. Sir Syed College, Taliparamba, Kerala, India

    P. N. Bajeel

  2. National Institute of Technology Calicut, Calicut, Kerala, India

    M. Kumar

Authors
  1. P. N. Bajeel
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  2. M. Kumar
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Corresponding author

Correspondence to P. N. Bajeel .

Editor information

Editors and Affiliations

  1. Department of Information Technology, Maulana Abul Kalam Azad University of Technology, Haringhata, West Bengal, India

    Debasis Giri

  2. School of Computing and Information Systems, University of Melbourne, Melbourne, VIC, Australia

    Rajkumar Buyya

  3. Department of Mathematics, Indian Institute of Technology Madras, Chennai, India

    S. Ponnusamy

  4. Department of Computer Science and Engineering, Maulana Abul Kalam Azad University of Technology, Haringhata, West Bengal, India

    Debashis De

  5. Unconventional Computing Laboratory, Department of Computer Science and Creative Technologies, University of the West of England, Bristol, UK

    Andrew Adamatzky

  6. Faculty of Science, Engineering and Built Environment, Deakin University Geelong, Geelong, VIC, Australia

    Jemal H. Abawajy

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© 2021 The Author(s), under exclusive license to Springer Nature Singapore Pte Ltd.

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Bajeel, P.N., Kumar, M. (2021). Design of Optimal Bayesian Reliability Test Plans for a Parallel System Based on Type-II Censoring. In: Giri, D., Buyya, R., Ponnusamy, S., De, D., Adamatzky, A., Abawajy, J.H. (eds) Proceedings of the Sixth International Conference on Mathematics and Computing. Advances in Intelligent Systems and Computing, vol 1262. Springer, Singapore. https://doi.org/10.1007/978-981-15-8061-1_39

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