Abstract
Consider a parallel system with n independent components. Assume that the lifetime of ith component follows an exponential distribution with unknown parameter. We assume that each failure rate is distinct and the priori information can be modeled by quasi-density function. Using squared error loss function, a Bayesian estimator for failure rate based on type-II censoring is used to get an estimate of system reliability. An optimal reliability test plan is designed and a non-linear integer optimization problem is formulated satisfying usual probability requirements (type-I and type-II error constraints). Several numerical examples are considered to illustrate the Bayesian approach of obtaining optimal reliability test plan for a parallel system.
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Bajeel, P.N., Kumar, M. (2021). Design of Optimal Bayesian Reliability Test Plans for a Parallel System Based on Type-II Censoring. In: Giri, D., Buyya, R., Ponnusamy, S., De, D., Adamatzky, A., Abawajy, J.H. (eds) Proceedings of the Sixth International Conference on Mathematics and Computing. Advances in Intelligent Systems and Computing, vol 1262. Springer, Singapore. https://doi.org/10.1007/978-981-15-8061-1_39
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DOI: https://doi.org/10.1007/978-981-15-8061-1_39
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