Skip to main content

Anti-screenshot Watermarking Algorithm About Archives Image Based on Deep Learning Model

  • Conference paper
  • First Online:
New Trends in Computer Technologies and Applications (ICS 2022)

Abstract

In recent years, there are an increasing number of incidents in which archives images have been ripped. Leak tracking is possible by adding an anti-screenshot digital watermark to an archive image. However, because an archives image's texture is single, there is a problem of low detection rate of watermark with the existing algorithm. So in order to improve the robustness of archives image anti-screenshot, we propose an anti-screenshot deep learning model (DLM): ScreenNet. It aims to enhance the background and enrich the texture with style transfer. Firstly, a preprocessing process based on style transfer is added before the archives image is input into the encoder. Secondly, the ripped images usually have moiré, so we generate a database of ripped archives images with moiré by means of a moiré network. Lastly, by improving the Stagstamp model, the watermark information is encoded/decoded through the improved ScreenNet model using the ripped archives image database as the noise layer. The experiment proves that the algorithm is able to resist anti-screenshot attacks and achieve the ability to detect watermark information to leak trace of ripped images.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 89.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 119.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Zhu, J., Kaplan, R., Johnson, J., Li, F.-F.: HiDDeN: hiding data with deep networks. In: Ferrari, V., Hebert, M., Sminchisescu, C., Weiss, Y. (eds.) Computer Vision – ECCV 2018: 15th European Conference, Munich, Germany, September 8-14, 2018, Proceedings, Part XV, pp. 682–697. Springer International Publishing, Cham (2018). https://doi.org/10.1007/978-3-030-01267-0_40

    Chapter  Google Scholar 

  2. Wengrowski, E., Dana, K.: Light field messaging with deep photographic steganography. In: IEEE Conference on Computer Vision and Pattern Recognition, pp.1515–1524 (2019)

    Google Scholar 

  3. Tancik, M., Mildenhall, B., Ng, R.: Stegastamp: invisible hyperlinks in physical photographs. In: IEEE Conference on Computer Vision and Pattern Recognition, pp. 2117–2126 (2020)

    Google Scholar 

  4. Simonyan, K., Zisserman, A.: Very deep convolutional networks for large-scale image recognition. arXiv preprint arXiv:1409.1556 (2014)

  5. Ronneberger, O., Fischer, P., Brox, T.: U-net: convolutional networks for biomedical image segmentation. In: Navab, N., Hornegger, J., Wells, W.M., Frangi, A.F. (eds.) Medical Image Computing and Computer-Assisted Intervention — MICCAI 2015. LNCS, vol. 9351, pp. 234–241. Springer, Cham (2015). https://doi.org/10.1007/978-3-319-24574-4_28

    Chapter  Google Scholar 

  6. Sun, Y., Yu, Y., Wang, W.: Moiré photo restoration using multiresolution convolutional neural networks. IEEE Trans. Image Process. 23(2), 4160–4172 (2018)

    Article  MATH  Google Scholar 

  7. Agustsson, E., Timofte, R.: NTIRE 2017 challenge on single image super-resolution: dataset and study. In: IEEE Conference on Computer Vision and Pattern Recognition Workshops, pp.1122–1131 (2017)

    Google Scholar 

  8. Cubuk, E.D., Zoph, B., Mane, D., Vasudevan, V., Le, Q.V.: AutoAugment: Learning augmentation policies from data. In: IEEE Conference on Computer Vision and Pattern Recognition, pp.113–123 (2019)

    Google Scholar 

  9. Zhang, R., Isola, P., Efros, A.A., Shechtman, E., Wang, O.: The unreasonable effectiveness of deep features as a perceptual metric. In: IEEE Conference on Computer Vision and Pattern Recognition, pp. 586–595 (2018)

    Google Scholar 

  10. Li, L., Doroslovacki, M., Loew, M.H.: Approximating the gradient of cross-entropy loss function. IEEE Access 8(1), 111626–111635 (2020)

    Article  Google Scholar 

  11. Li, X.-W., et al.: Area-Preserving hierarchical NURBS surfaces computed by the optimal freeform transformation. Comput. Aided Des. 143, 103134 (2022). https://doi.org/10.1016/j.cad.2021.103134

    Article  MathSciNet  Google Scholar 

  12. Huiskes, M.J., Lew, M.S.: The MIR flickr retrieval evaluation. In: ACM International Conference on Multimedia Information Retrieval, pp.39–46 (2008)

    Google Scholar 

Download references

Acknowledgments

This work was partially supported by National Natural Science Foundation of China (No. 62172132) and Science and Technology Projects of National Archives Administration of China (No. 2020-X-058).

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Li Li .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2022 The Author(s), under exclusive license to Springer Nature Singapore Pte Ltd.

About this paper

Check for updates. Verify currency and authenticity via CrossMark

Cite this paper

Gu, W., Chang, CC., Bai, Y., Fan, Y., Tao, L., Li, L. (2022). Anti-screenshot Watermarking Algorithm About Archives Image Based on Deep Learning Model. In: Hsieh, SY., Hung, LJ., Klasing, R., Lee, CW., Peng, SL. (eds) New Trends in Computer Technologies and Applications. ICS 2022. Communications in Computer and Information Science, vol 1723. Springer, Singapore. https://doi.org/10.1007/978-981-19-9582-8_31

Download citation

  • DOI: https://doi.org/10.1007/978-981-19-9582-8_31

  • Published:

  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-19-9581-1

  • Online ISBN: 978-981-19-9582-8

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics