Skip to main content

S3DA: A 3D Point Cloud Based PCB Solder Defect Detection Algorithm

  • Conference paper
  • First Online:
Software Fault Prevention, Verification, and Validation (SFPVV 2024)

Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 15393))

  • 119 Accesses

Abstract

Surface Mount Technology (SMT) is prevalent in Printed Circuit Board (PCB) assembly, mainly using solder printing to connect the components and the board. During the process of solder printing, solder defects due to machine failure and environmental factors are widespread. Existing defect detection methods mainly use computer vision to detect solder defects. The main idea of this type of method is to obtain the image information and defect features of the PCB and use the machine learning model to identify the solder defects of the PCB. In actual industrial PCB assembly, the lack of illumination and the occlusion caused by other workpieces leads to incomplete input images for machine learning models, which makes existing methods unable to detect such occluded defects. In order to solve the above problems, this paper proposes a new algorithm for solder defect detection using 3D point cloud data. First, the point cloud data is obtained by scanning the 3D point cloud camera. Next, the point cloud data is denoised and filtered, and the area of interest is further screened to obtain the solder area to be calculated. Finally, using the idea based on integral summation, solder defects are identified by calculating the solder volume. This algorithm can automatically assist manual judgment and effectively identify possible defects in solder processing.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Subscribe and save

Springer+ Basic
$34.99 /Month
  • Get 10 units per month
  • Download Article/Chapter or eBook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Acciani, G., Brunetti, G., Fornarelli, G.: Automatic detection of solder joint defects on integrated circuits. In: IEEE International Symposium on Circuits and Systems. IEEE 2007, 1021–1024 (2007)

    Google Scholar 

  2. Dai, W., Mujeeb, A., Erdt, M., Sourin, A.: 2018 International Conference on Cyberworlds (CW). In: Towards Automatic Optical Inspection Of Soldering Defects, pp. 375–382. IEEE (2018)

    Google Scholar 

  3. Burr, D.: Proceedings International Test Conference 1997. In: Solder Paste Inspection: Process Control For Defect Reduction, p. 1036. IEEE (1997)

    MATH  Google Scholar 

  4. Mak, C.W., Afzulpurkar, N.V., Dailey, M.N., Saram, P.B.: A Bayesian approach to automated optical inspection for solder jet ball joint defects in the head gimbal assembly process. IEEE Trans. Autom. Sci. Eng. 11(4), 1155–1162 (2014)

    Article  Google Scholar 

  5. Kim, J., Ko, J., Choi, H., Kim, H.: Printed circuit board defect detection using deep learning via a skip-connected convolutional autoencoder. Sensors 21(15), 4968 (2021)

    Article  MATH  Google Scholar 

  6. Taha, E.M., Emary, E., Moustafa, K.: Automatic optical inspection for pcb manufacturing: A survey. Int. J. Sci. Eng. Res. 5(7), 1095–1102 (2014)

    MATH  Google Scholar 

  7. Shao, Z., Hao, K., Wei, B., Tang, X.-S., Solder joint defect detection based on depth image cnn for 3d shape classification, in,: CAA Symposium on Fault Detection, Supervision, and Safety for Technical Processes (SAFEPROCESS). IEEE 2021, 1–6 (2021)

    Google Scholar 

  8. Lu, Z., He, Q., Xiang, X., Liu, H.: Defect detection of PCB based on Bayes feature fusion. J. Eng. 2018(16), 1741–1745 (2018)

    MATH  Google Scholar 

  9. Dai, W., Mujeeb, A., Erdt, M., Sourin, A.: Soldering defect detection in automatic optical inspection. Adv. Eng. Inform. 43, 101004 (2020)

    Article  Google Scholar 

  10. Gaidhane, V.H., Hote, Y.V., Singh, V.: An efficient similarity measure approach for pcb surface defect detection. Pattern Anal. Appl. 21(1), 277–289 (2018)

    Article  MathSciNet  MATH  Google Scholar 

  11. Gao, H., Jin, W., Yang, X., Kaynak, O.: A line-based-clustering approach for ball grid array component inspection in surface-mount technology. IEEE Trans. Industr. Electron. 64(4), 3030–3038 (2016)

    Article  MATH  Google Scholar 

  12. Sa-nguannam, A., Srinonchat, J.: 2008 9th International Conference on Signal Processing. In: Analysis Ball Grid Array Defects By Using New Image Technique, pp. 785–788. IEEE (2008)

    Google Scholar 

  13. Abdelhameed, M.M., Awad, M.A., Abd El-Aziz, H.M.: 2013 8th International Conference on Computer Engineering & Systems (ICCES). In: A Robust Methodology For Solder Joints Extraction, pp. 268–273. IEEE (2013)

    Google Scholar 

  14. Ma, H., Zhang, H.: PCB component rotation detection based on polarity identifier attention. In: Iliadis, L., Papaleonidas, A., Angelov, P., Jayne, C. (eds.) Artificial Neural Networks and Machine Learning – ICANN 2023: 32nd International Conference on Artificial Neural Networks, Heraklion, Crete, Greece, September 26–29, 2023, Proceedings, Part IX, pp. 140–151. Springer Nature Switzerland, Cham (2023). https://doi.org/10.1007/978-3-031-44201-8_12

    Chapter  MATH  Google Scholar 

  15. Liu, W., et al.: SSD: single shot multibox detector. In: Leibe, B., Matas, J., Sebe, N., Welling, M. (eds.) Computer Vision – ECCV 2016: 14th European Conference, Amsterdam, The Netherlands, October 11–14, 2016, Proceedings, Part I, pp. 21–37. Springer International Publishing, Cham (2016). https://doi.org/10.1007/978-3-319-46448-0_2

    Chapter  MATH  Google Scholar 

  16. Redmon, J., Divvala, S., Girshick, R., Farhadi, A.: You only look once: unified, real-time object detection. In: Proceedings of the IEEE Conference on Computer Vision And Pattern Recognition, pp. 779–788 (2016)

    Google Scholar 

  17. Tsan, T.-C., Shih, T.-F., Fuh, C.-S.: Tsankit: artificial intelligence for solder ball head-in-pillow defect inspection. Mach. Vis. Appl. 32(3), 1–17 (2021)

    Article  MATH  Google Scholar 

  18. Tang, S., He, F., Huang, X., Yang, J.: Online pcb defect detector on a new pcb defect dataset, arXiv preprint arXiv:1902.06197 (2019)

  19. Tham, M.-L., Chong, B.Y., Tan, Y.H., Wong, Y.K., Chean, S.L., Tan, W.K.: 2022 IEEE International Conference on Artificial Intelligence in Engineering and Technology (IICAIET). In: Optimizing Deep Learning Inference to Detect PCB Soldering Defects, pp. 1–5. IEEE (2022)

    MATH  Google Scholar 

  20. Vafeiadis, T., Dimitriou, N., Ioannidis, D., Wotherspoon, T., Tinker, G., Tzovaras, D.: A framework for inspection of dies attachment on PCB utilizing machine learning techniques. J. Manage. Analy. 5(2), 81–94 (2018)

    MATH  Google Scholar 

  21. Ye, S.-Q., Xue, C.-S., Jian, C.-Y., Chen, Y.-Z., Gung, J.-J., Lin, C.-Y.: A Deep Learning-based Generic Solder Defect Detection System. In: 2022 IEEE International Conference on Consumer Electronics-Taiwan, pp. 99–100. IEEE (2022)

    Google Scholar 

  22. Liu, W., Sun, J., Li, W., Hu, T., Wang, P.: Deep learning on point clouds and its application: a survey. Sensors 19(19), 4188 (2019)

    Article  MATH  Google Scholar 

  23. Hu, Q., Hao, K., Wei, B., Li, H.: An efficient solder joint defects method for 3d point clouds with double-flow region attention network. Adv. Eng. Inform. 52, 101608 (2022)

    Article  MATH  Google Scholar 

Download references

Acknowledgement

This work is supported by the National Natural Science Foundation of China for Young Scientists (Grant 62202166, NSFC), the Shanghai Pujiang Program (Category D) (Grant 22PJD021), the CCF-Huawei Populus Grove Fund (Grant CCF-HuaweiTC202304, CCF-Huawei), National Trusted Embedded Software Engineering Technology Research Center (East China Normal University).

Author information

Authors and Affiliations

Authors

Corresponding authors

Correspondence to Yueling Zhang , Jincao Feng or Weikai Miao .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2025 The Author(s), under exclusive license to Springer Nature Singapore Pte Ltd.

About this paper

Check for updates. Verify currency and authenticity via CrossMark

Cite this paper

Xu, Y. et al. (2025). S3DA: A 3D Point Cloud Based PCB Solder Defect Detection Algorithm. In: Liu, S. (eds) Software Fault Prevention, Verification, and Validation. SFPVV 2024. Lecture Notes in Computer Science, vol 15393. Springer, Singapore. https://doi.org/10.1007/978-981-96-1621-3_8

Download citation

  • DOI: https://doi.org/10.1007/978-981-96-1621-3_8

  • Published:

  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-96-1620-6

  • Online ISBN: 978-981-96-1621-3

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics