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Design and Implementation of Optical Lens Defect Detection and Classification System

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Technologies and Applications of Artificial Intelligence (TAAI 2023)

Abstract

The glass lens production process requires cutting, grinding and polishing, it is easy to cause lens defects, and the production quality needs to be maintained through inspection. In the past, people relied on manual methods to detect the defects, but it causes inconsistent quality standards and costs a lot of manpower to carry out this operation. In this paper, we developed a proper image acquisition system and combine deep learning techniques and image processing algorithms to implement stringent inspection criteria based on different inspection specification requirements. Finally, a defect detection and classification system for glass lenses was successfully implemented with a defect recognition accuracy of over 95% by comparison and verification.

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References

  1. Zhang, X., Wang, Q., Liu, J., Liu, Z., Gong, J.: Zipper classification and defect detection based on computer vision. In: 2020 39th Chinese Control Conference (CCC), pp. 6521–6526 (2020)

    Google Scholar 

  2. Shang, L., Yang, Q., Wang, J., Li, S., Lei, W.: Detection of rail surface defects based on CNN image recognition and classification. In: 2018 20th International Conference on Advanced Communication Technology (ICACT), pp. 45–51 (2018)

    Google Scholar 

  3. Liu, G.: Surface defect detection methods based on deep learning: a brief review. In: 2020 2nd Information Technology and Computer Application (ITCA), pp. 200–203 (2020)

    Google Scholar 

  4. Phua, C., Theng, L.B.: Semiconductor wafer surface: automatic defect classification with deep CNN. In: 2020 IEEE Region 10 Conference (TENCON), pp. 714–719 (2020)

    Google Scholar 

  5. Ieamsaard, J., Charoensook, S.N., Yammen, S.: Deep learning-based face mask detection using YoloV5. In: 2021 9th International Electrical Engineering Congress (iEECON), pp. 428–431 (2021)

    Google Scholar 

  6. Li, B., Fu, M., Li, Q.: Runway crack detection based on YOLOV5. In: 2021 IEEE 3rd International Conference on Civil Aviation Safety and Information Technology (ICCASIT), pp. 1252–1255 (2021)

    Google Scholar 

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Acknowledgement

The authors wish to express their appreciation for the financial support of the National Science Council of Taiwan under project 111-2221-E-224-051-

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Correspondence to Syuan-Ciao Huang .

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© 2024 The Author(s), under exclusive license to Springer Nature Singapore Pte Ltd.

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Wu, HH., Lin, CY., Huang, SC. (2024). Design and Implementation of Optical Lens Defect Detection and Classification System. In: Lee, CY., Lin, CL., Chang, HT. (eds) Technologies and Applications of Artificial Intelligence. TAAI 2023. Communications in Computer and Information Science, vol 2075. Springer, Singapore. https://doi.org/10.1007/978-981-97-1714-9_2

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  • DOI: https://doi.org/10.1007/978-981-97-1714-9_2

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-97-1713-2

  • Online ISBN: 978-981-97-1714-9

  • eBook Packages: Computer ScienceComputer Science (R0)

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