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Identifying Self-admitted Technical Debt with Context-Based Ladder Network

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Neural Information Processing (ICONIP 2023)

Abstract

Technical debt occurs when development teams take actions to expedite the delivery of a project at the cost of poor code quality and additional work of later refactoring. The accumulation of technical debt will make the software fixes prohibitively expensive. As a typical type of technical debt, Self-Admitted Technical Debt (SATD) is acknowledged by developers in code comments. Identifying SATD in code comments can improve code quality. However, manually discerning whether code comments contain SATD would be expensive and time-consuming. To solve this problem, we propose a method to apply the Ladder Network with the pre-training model to identify SATD based on the labeled data from 10 open source projects and the unlabeled data from another ten projects. By comparing with the original model of Ladder Network, and other semi-supervised learning models, the results show that the proposed method performs better in technical debt identification. In addition, the proposed method also achieves better results compared with supervised learning methods. This shows that our approach can make better use of unlabeled data to improve classification performance.

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Acknowledgements

We would like to thank anonymous reviewers for their helpful comments and suggestions. This work is supported by Support Center for Advanced Telecommunications Technology Research (SCAT), JKA, Kajima Foundation’s Support Program, JSPS KAKENHI (No. 21K12026, 22K12146 and 23H03402), and National Natural Science Foundation of China (No. 62372145).

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Correspondence to Fumiyo Fukumoto .

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Gong, A., Fukumoto, F., Muangkammuen, P., Li, J., Yu, D. (2024). Identifying Self-admitted Technical Debt with Context-Based Ladder Network. In: Luo, B., Cheng, L., Wu, ZG., Li, H., Li, C. (eds) Neural Information Processing. ICONIP 2023. Communications in Computer and Information Science, vol 1969. Springer, Singapore. https://doi.org/10.1007/978-981-99-8184-7_7

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  • DOI: https://doi.org/10.1007/978-981-99-8184-7_7

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