Abstract
It is often stated that in irredundant two-level logic circuits, a test set for all single stuck faults will also detect all multiple stuck faults. We show by a simple example that this result does not hold for multi-output circuits even when each output function is prime and irredundant. Using a result from the programmable logic array technology, we give an output ordering constraint that, if satisfied during test generation, will make a single stuck fault test set a valid multiple stuck fault test set for irredundant two-level multi-output circuits.
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Jacob, J., Agrawal, V.D. Multiple fault detection in two-level multi-output circuits. J Electron Test 3, 171–173 (1992). https://doi.org/10.1007/BF00137254
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DOI: https://doi.org/10.1007/BF00137254