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A general purpose design-for-test methodology at the analog-digital boundary of mixed-signal VLSI

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Abstract

A general-purpose modular-based scan chain between the analog-digital boundary of a mixed analog/digital design is proposed. This general-purpose Design-For-Test methodology is oriented towards the test of the mixed-signal modules within the design. Implementing this structure improves the controllability and observability of these modules and the reusability of the test software at a minimum cost.

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Authors and Affiliations

  1. Alcatel Bell Telephone, Advanced Research Center, Francis Wellesplein 1, B-2018, Antwerpen, Belgium

    Johan Verfaillie & Didier Haspeslagh

Authors
  1. Johan Verfaillie
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  2. Didier Haspeslagh
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Verfaillie, J., Haspeslagh, D. A general purpose design-for-test methodology at the analog-digital boundary of mixed-signal VLSI. J Electron Test 9, 109–115 (1996). https://doi.org/10.1007/BF00137568

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  • DOI: https://doi.org/10.1007/BF00137568

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