Abstract
The computation of probabilistic testability measures has become increasingly important and some methods have been proposed, although the exact solution of the problem is NP-hard. An exact analytical method for singleoutput combinational circuits is extended to deal with multi-output circuits. Such circuits are reduced to singleoutput ones by introducing a dummy gate, the “X-gate,” and applying to the resulting graph the analysis based on supergates.
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Camurati, P., Prinetto, P. & Reorda, M.S. Exact probabilistic testability measures for multi-output circuits. J Electron Test 1, 229–234 (1990). https://doi.org/10.1007/BF00938686
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DOI: https://doi.org/10.1007/BF00938686