Abstract
This article emphasizes the criticality of maximizing “value adders” and minimizing the costs of “design for test” (DFT) in order to remain competitive in ASIC manufacturing in the 90s.
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Zarrinfar, F. Economics of “design for test” to remain competitive in the 90s. J Electron Test 5, 171–177 (1994). https://doi.org/10.1007/BF00972077
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DOI: https://doi.org/10.1007/BF00972077