Abstract
A design-for-test methodology for SC filters is presented, based on an architecture using some additional circuitry and providing extra capabilities for both off-and on-line tests. The approach uses a comparison (voting) mechanism to indicate whether or not two copies of a filter element (a biquad, for instance) have a similar response during their actual operation. The design and implementation of a few filter examples are included to assess the potential usefulness of this new approach.
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Huertas, J.L., Rueda, A. & Vázquez, D. Improving the testability of switched-capacitor filters. J Electron Test 4, 299–313 (1993). https://doi.org/10.1007/BF00972156
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DOI: https://doi.org/10.1007/BF00972156