Abstract
Analog circuit testing is considered to be a very difficult task. This difficulty is mainly due to the lack of fault models and accessibility to internal nodes. To overcome this problem, an approach is presented for analog circuit modeling and testing. The circuit modeling is based on first-order sensitivity computation. The testability of the circuit is analyzed by the multiple-fault model and by functional testing. Component deviations are deduced by measuring a number of output parameters, and through sensitivity analysis and tolerance computation. Using this approach, adequate tests are identified for testing catastrophic and soft faults. Some experimental results are presented for simple models as well as multiple-fault models.
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Hamida, N.B., Kaminska, B. Multiple fault analog circuit testing by sensitivity analysis. J Electron Test 4, 331–343 (1993). https://doi.org/10.1007/BF00972158
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DOI: https://doi.org/10.1007/BF00972158