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Editorial—Special issue on partial scan design

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Authors
  1. Vishwani D. Agrawal
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AT&T Bell Laboratories

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Agrawal, V.D. Editorial—Special issue on partial scan design. J Electron Test 7, 5–6 (1995). https://doi.org/10.1007/BF00993310

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  • DOI: https://doi.org/10.1007/BF00993310