Abstract
A method is proposed to obtain a minimal set of test nodes of an analog circuit for isolating all faulty conditions in the fault dictionary approach. Relevant theorem along with the proof is also given. Proposed method is extremely fast. This method is illustrated with an active filter circuit example.
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References
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Prasad, V.C., Babu, N.S.C. On minimal set of test nodes for fault dictionary of analog circuit fault diagnosis. J Electron Test 7, 255–258 (1995). https://doi.org/10.1007/BF00995317
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DOI: https://doi.org/10.1007/BF00995317