Abstract
Neural network software can be applied to manufacturing process control as a tool for diagnosing the state of an electronic circuit board. The neural network approach significantly reduces the amount of time required to build a diagnostic system. This time reduction occurs because the ordinary combinatorial explosion in rules for identifying faulted components can be avoided. Neural networks circumvent the combinatorial explosion by taking advantage of the fact that the fault characteristics of multiple simultaneous faults frequently correlate to the fault characteristics of the individual faulted components. This article clearly demonstrates that state-of-the-art neural networks can be used in automatic test equipment for iterative diagnosis of electronic circuit board malfunctions.
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References
DARPA (1988)DARPA Neural Network Study, AFCEA International Press, Fairfax, VA.
Friedman, A. D. and Menon, P. R. (1971)Fault Detection in digital Circuits, Prentice-Hall.
Hecht-Nielson, R. (1989) Theory of the backpropagation neural network, inProceedings of the International Joint Conference on Neural Networks,I, p. 593.
Jakubowicz, O. and Ramanujam, S. (1989) A neural network model for fault-diagnosis of digital circuits, inProceedings of the International Joint Conference on Neural Networks,II, p. 611.
Koos, L. J. and Reeder, J. R. (1990) A neural net approach to electronic circuit diagnostics, inProceedings of the International Joint Conference on Neural Networks,II, p. 671.
Le Cun, Y. (1985) Une procedure d'apprentissage pour reseau a seuil assymetrique [A learning procedure for asymmetric threshold network] inProceedings of Cognitiva 85, p. 599.
NeuralWare, Inc. (1988)NeuralWorks User's Guide, Networks I, andNetworks II, Revision 2.0.
Parker, D. B. (1985) Learning-logic, MIT Center for Computational Research in Economics and Management Science Technical Report TR-47, Cambridge, MA.
Rosenblatt, F. (1962)Principles of Neurodynamics, Spartan Books, Washington D.C.
Simpson, P. K. (1990)Artificial Neural Systems, Pergamon Press, NY.
Werbos, P. (1974) Beyond regression: new tools for prediction and analysis in behavioral sciences, PhD Thesis, Harvard University.
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Murphy, J.H., Kagle, B.J. Neural network recognition of electronic malfunctions. J Intell Manuf 3, 205–216 (1992). https://doi.org/10.1007/BF01473898
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DOI: https://doi.org/10.1007/BF01473898