Skip to main content

Advertisement

Log in

Neural network recognition of electronic malfunctions

  • Papers
  • Published:
Journal of Intelligent Manufacturing Aims and scope Submit manuscript

Abstract

Neural network software can be applied to manufacturing process control as a tool for diagnosing the state of an electronic circuit board. The neural network approach significantly reduces the amount of time required to build a diagnostic system. This time reduction occurs because the ordinary combinatorial explosion in rules for identifying faulted components can be avoided. Neural networks circumvent the combinatorial explosion by taking advantage of the fact that the fault characteristics of multiple simultaneous faults frequently correlate to the fault characteristics of the individual faulted components. This article clearly demonstrates that state-of-the-art neural networks can be used in automatic test equipment for iterative diagnosis of electronic circuit board malfunctions.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Subscribe and save

Springer+
from $39.99 /Month
  • Starting from 10 chapters or articles per month
  • Access and download chapters and articles from more than 300k books and 2,500 journals
  • Cancel anytime
View plans

Buy Now

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  • DARPA (1988)DARPA Neural Network Study, AFCEA International Press, Fairfax, VA.

    Google Scholar 

  • Friedman, A. D. and Menon, P. R. (1971)Fault Detection in digital Circuits, Prentice-Hall.

  • Hecht-Nielson, R. (1989) Theory of the backpropagation neural network, inProceedings of the International Joint Conference on Neural Networks,I, p. 593.

  • Jakubowicz, O. and Ramanujam, S. (1989) A neural network model for fault-diagnosis of digital circuits, inProceedings of the International Joint Conference on Neural Networks,II, p. 611.

  • Koos, L. J. and Reeder, J. R. (1990) A neural net approach to electronic circuit diagnostics, inProceedings of the International Joint Conference on Neural Networks,II, p. 671.

  • Le Cun, Y. (1985) Une procedure d'apprentissage pour reseau a seuil assymetrique [A learning procedure for asymmetric threshold network] inProceedings of Cognitiva 85, p. 599.

  • NeuralWare, Inc. (1988)NeuralWorks User's Guide, Networks I, andNetworks II, Revision 2.0.

  • Parker, D. B. (1985) Learning-logic, MIT Center for Computational Research in Economics and Management Science Technical Report TR-47, Cambridge, MA.

  • Rosenblatt, F. (1962)Principles of Neurodynamics, Spartan Books, Washington D.C.

    Google Scholar 

  • Simpson, P. K. (1990)Artificial Neural Systems, Pergamon Press, NY.

    Google Scholar 

  • Werbos, P. (1974) Beyond regression: new tools for prediction and analysis in behavioral sciences, PhD Thesis, Harvard University.

Download references

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

About this article

Cite this article

Murphy, J.H., Kagle, B.J. Neural network recognition of electronic malfunctions. J Intell Manuf 3, 205–216 (1992). https://doi.org/10.1007/BF01473898

Download citation

  • Received:

  • Accepted:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF01473898

Keywords